| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| JB/T 9326-1999 |
Laser Raman spectrophotometer |
274.0 |
via email in 1~3 business day |
abolished2017-05-12 ,,2000-1-1 |
|
| JB/T 9352-1999 |
Test method for the transmission electron microscope |
370.0 |
via email in 1~3 business day |
abolished2010-01-20 ,,2000-1-1 |
|
| JB/T 9401-1999 |
X-Ray fluorescence analysing tube |
380.0 |
via email in 1~3 business day |
abolished2010-01-20 ,,2000-1-1 |
|
| JB/T 8239.2-1999 |
Specification for diffraction grating |
224.0 |
via email in 1~3 business day |
valid,,2000-1-1 |
|
| JB/T 9323-1999 |
Photoelasticimeter |
300.0 |
via email in 1~3 business day |
abolished2010-01-20 ,,2000-1-1 |
|
| JB/T 9400-1999 |
Specification for X-ray diffractometer |
340.0 |
via email in 1~3 business day |
abolished2010-07-01 ,2010-7-1,2000-1-1 |
|
| JB/T 9320-1999 |
Plane-gratings spectrographs |
380.0 |
via email in 1~3 business day |
abolished2010-01-20 ,,2000-1-1 |
|
| JB/T 9325-1999 |
Spectrophotometer series and its basic parameter |
220.0 |
via email in 1~3 business day |
abolished2017-05-12 ,,2000-1-1 |
|
| JB/T 8235-1999 |
Monochromator |
260.0 |
via email in 1~3 business day |
abolished2010-01-20 ,,2000-1-1 |
|
| JB/T 8231-1999 |
The basic parameters of the plane-gratings spectrographs |
180.0 |
via email in 1~3 business day |
abolished2010-01-20 ,,2000-1-1 |
|
| GB/T 17507-1998 |
General specification of thin biological STANDARDs for X-ray EDS microanalysis in electron microscope |
264.0 |
via email in 1~3 business day |
superseded,2009-3-1,1999-7-1 |
|
| GB/T 17506-1998 |
The method of electron probe microanalysis as corrosive layer on ferrous metals of ship |
264.0 |
via email in 1~3 business day |
superseded,2009-3-1,1999-7-1 |
|
| GB/T 17723-1999 |
Surface composition analysis method of gold-plated products by EDX |
264.0 |
via email in 1~3 business day |
superseded,2009-5-1,1999-1-2 |
|
| GB/T 17722-1999 |
Gold-plated thickness measurement by SEM |
90.0 |
via email in 1~3 business day |
valid,,1999-1-2 |
|
| GB/T 17360-1998 |
Method of quantitative electron probe microanalysis on low contents of Si and Mn in steels |
100.0 |
via email in 1~3 business day |
superseded2009-03-01,2009-3-1,1998-1-2 |
|
| GB/T 17362-1998 |
Nondestructive method of X-ray EDS analysis with SEM for gold jewelry |
220.0 |
via email in 1~3 business day |
valid,,1998-1-2 |
|
| GB/T 17364-1998 |
Non-damage quantitative analysis of gold content in gold products |
120.0 |
via email in 1~3 business day |
superseded2009-12-01,2009-12-1,1998-1-2 |
|
| GB/T 17363-1998 |
Method of quantitative electron probe microanalysis on gold products |
224.0 |
via email in 1~3 business day |
superseded2009-12-01,2009-12-1,1998-1-2 |
|
| GB/T 17365-1998 |
Method of preparation for samples of metal and alloy in electron probe microanalysis |
110.0 |
via email in 1~3 business day |
superseded2025-10-01,2025-10-1,1998-1-2 |
|
| JY/T 011-1996 |
General rules for transmission electron microscopy |
120.0 |
via email in 1~3 business day |
superseded,2020-12-1,1997-4-1 |
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