| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| JY/T 012-1996 |
General rules for metallographic microscopy |
75.0 |
via email in 1~3 business day |
superseded,2020-12-1,1997-4-1 |
|
| JY/T 001-1996 |
General rules for fourier transform infrared spectrometer |
370.0 |
via email in 1~3 business day |
valid,,1997-4-1 |
|
| GB/T 16594-1996 |
Micron grade lenght measurement by SEM |
224.0 |
via email in 1~3 business day |
superseded2009-05-01,2009-5-1,1997-4-1 |
|
| GB 7667-1996 |
The dose of X-rays leakage from electron microscope |
184.0 |
via email in 1~3 business day |
superseded2004-05-01,2004-5-1,1996-12-1 |
|
| GB/T 15617-1995 |
Qantitative analysis method for silicate minerals by EPMA |
184.0 |
via email in 1~3 business day |
superseded2003-06-01,2003-6-1,1996-2-1 |
|
| GB/T 15616-1995 |
Qantitative method for electron probe microanalysis of metals and alloys |
264.0 |
via email in 1~3 business day |
superseded2009-04-01,2009-4-1,1996-2-1 |
|
| GB/T 6360-1995 |
Specification for laser radiation power and energy measuring equipment |
120.0 |
via email in 1~3 business day |
valid,,1996-1-1 |
|
| GB/T 15245-1994 |
Standard method for quantitative electorn probe microanalysis of ree oxides |
224.0 |
via email in 1~3 business day |
superseded2003-06-01,2003-6-1,1995-6-1 |
|
| GB/T 15246-1994 |
Standard method for electron probe microanalysis of sulfide minerals |
184.0 |
via email in 1~3 business day |
superseded2003-06-01,2003-6-1,1995-6-1 |
|
| GB/T 15247-1994 |
Electron probe quantitative analysis method of carbon in carbon steel and low alloy steel－Sensitivity curve method (detection limit method) |
264.0 |
via email in 1~3 business day |
superseded2009-04-01,2009-4-1,1995-6-1 |
|
| GB/T 15244-1994 |
Quantitative analysis method of electron probe on glasses |
180.0 |
via email in 1~3 business day |
superseded,2003-6-1,1995-6-1 |
|
| JB/T 7399-1994 |
Collimator |
120.0 |
via email in 1~3 business day |
superseded2025-05-01,2025-5-1,1995-5-1 |
|
| GB/T 15075-1994 |
Method for testing EPMA instrument |
220.0 |
via email in 1~3 business day |
abolished2005-10-14 ,,1994-1-2 |
|
| GB/T 15074-1994 |
General guide for EPMA quantitative analysis |
150.0 |
via email in 1~3 business day |
superseded2009-03-01,2009-3-1,1994-1-2 |
|
| JB/T 6779-1993 |
Infrared Spectrophotometer |
120.0 |
via email in 1~3 business day |
abolished2017-05-12 ,,1994-1-1 |
|
| JB/T 6778-1993 |
UV/VIS Near Infrared Spectrophotometer |
150.0 |
via email in 1~3 business day |
valid,,1994-1-1 |
|
| JB/T 6777-1993 |
UV/VIS Spectrophotometer |
180.0 |
via email in 1~3 business day |
valid,,1994-1-1 |
|
| JB/T 6842-1993 |
Test Method of Scanning Electron Microscope |
150.0 |
via email in 1~3 business day |
abolished2017-05-12 ,,1994-1-1 |
|
| JB/T 6780-1993 |
Atomic Absorption Spectrophotometer |
120.0 |
via email in 1~3 business day |
valid,,1994-1-1 |
|
| JB/T 6841-1993 |
Terminology of Electronic Optical Instrument |
210.0 |
via email in 1~3 business day |
abolished2017-05-12 ,,1994-1-1 |
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