| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| GB/T 2596-1981 |
Tungsten powder and tungsten carbide powder; Determination of specific surface product(average graininess) ; Simplified nitrogen absorption method |
$100.00 |
via email in 1~3 business day |
abolished2005-10-14,,1982-3-1 |
|
| GB/T 26068-2018 |
Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method |
$435.00 |
via email in 1~5 business day |
valid,,2019-11-1 |
|
| GB/T 28871-2012 |
Critical current measurement-DC critical current of Nb3Sn composite superconductors |
$390.00 |
via email in 1~3 business day |
valid,,2013-2-15 |
|
| GB/T 30140-2013 |
Measuring method for the shielding effectiveness of magnetic material in low frequency alternating magnetic field |
$210.00 |
via email in 1~3 business day |
valid,,2014-5-14 |
|
| GB/T 30537-2014 |
Superconductivity - Measurements for Bulk High Temperature Superconductors - Trapped Flux Density of Large Grain Oxide Superconductors |
$300.00 |
via email in 1~5 business day |
valid,,2014-11-1 |
|
| GB/T 30653-2014 |
Test method for crystal quality of Ⅲ-nitride epitaxial layers |
$150.00 |
via email in 1~3 business day |
valid,,2015-9-1 |
|
| GB/T 30654-2014 |
Test method for lattice constant of Ⅲ-nitride epitaxial layers |
$150.00 |
via email in 1~3 business day |
valid,,2015-9-1 |
|
| GB/T 30655-2014 |
Test methods for internal quantum efficiency of nitride LED epitaxial layers |
$150.00 |
via email in 1~3 business day |
valid,,2015-9-1 |
|
| GB/T 30857-2014 |
Standard test method for thickness and thickness variation on sapphire substrates |
$100.00 |
via email in 1~3 business day |
valid,,2015-4-1 |
|
| GB/T 30859-2014 |
Test method for warp and waviness of silicon wafers for solar cells |
$180.00 |
via email in 1~3 business day |
valid,,2015-4-1 |
|
| GB/T 30860-2014 |
Test methods for surface roughness and saw mark of silicon wafers for solar cells |
$180.00 |
via email in 1~3 business day |
valid,,2015-4-1 |
|
| GB/T 30869-2014 |
Test method for thickness and total thickness variation of silicon wafers for solar cell |
$150.00 |
via email in 1~3 business day |
valid,,2015-2-1 |
|
| GB/T 31352-2014 |
Test methods for warp of sapphire substrates |
$150.00 |
via email in 1~3 business day |
valid,,2015-9-1 |
|
| GB/T 31353-2014 |
Test methods for bow of sapphire substrates |
$150.00 |
via email in 1~3 business day |
valid,,2015-9-1 |
|
| GB/T 31474-2015 |
Soldering fluxes for high-quality interconnections in electronics assembly |
$310.00 |
via email in 1~5 business day |
valid,,2016-1-1 |
|
| GB/T 31475-2015 |
Requirements for solder paste for high-quality interconnections in electronics assembly |
$250.00 |
immediately |
valid,,2016-1-1 |
|
| GB/T 3170.1-1982 |
Determination of particle size of aluminum powder--Mechanical vibration sieve method |
$300.00 |
via email in 1~3 business day |
abolished2005-10-14 ,,1983-6-1 |
|
| GB/T 3170.2-1982 |
Determination of particle size of aluminum powder--Manual-air-blowing sieve method |
$180.00 |
via email in 1~3 business day |
abolished2005-10-14 ,,1983-6-1 |
|
| GB/T 3170.3-1982 |
Determination of particle size of aluminum powder--Sieve analysis with alcohol |
$180.00 |
via email in 1~3 business day |
abolished2005-10-14 ,,1983-6-1 |
|
| GB/T 3171.1-1982 |
Determination of apparent density of aluminum powder--Funnel method |
$180.00 |
via email in 1~3 business day |
abolished2005-10-14 ,,1983-6-1 |
|
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* Related standard quantity: * Page quantity: *
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