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DL/T 2310-2021 Acceptance specification for silicon carbide epitaxial wafer of high voltage power devices in the grid system
Issued on: 2021-04-26 Price(USD): 135.0 |
GB/T 11072-2009 Indium antimonide polycrystal,single crystals and as-cut slices
Issued on: 2009-10-30 Price(USD): 140.0 |
GB/T 11093-2007 Liquid encapsulated czochralski-grown gallium arsenide single crystals and as-cut slices
Issued on: 2007-12-18 Price(USD): 210.0 |
GB/T 11094-2007 Horizontal bridgman grown gallium arsenide single crystal and cutting wafer
Issued on: 2007-12-18 Price(USD): 180.0 |
GB/T 11094-2020 Gallium arsenide single crystal and cutting wafer grown by horizontal bridgman method
Issued on: 2020-09-29 Price(USD): 180.0 |
GB/T 12962-1996 Monocrystalline silicon
Issued on: 1996-01-01 Price(USD): 120.0 |
GB/T 12962-2005 Monoccrystalline silicon
Issued on: 2005-9-19 Price(USD): 130.0 |
GB/T 12962-2015 Monocrystalline silicon
Issued on: 2015-12-10 Price(USD): 160.0 |
GB/T 12963-1996 Polycrystalline silicon
Issued on: 1996-01-01 Price(USD): 224.0 |
GB/T 12963-2009 Specification for Polycrystalline Silicon
Issued on: 2009-10-30 Price(USD): 40.0 |
GB/T 12963-2014 Electronic-grade polycrystalline silicon
Issued on: 2014-12-31 Price(USD): 80.0 |
GB/T 12963-2022 Electronic-grade polycrystalline silicon
Issued on: 2022-12-30 Price(USD): 165.0 |
GB/T 12964-1996 Monocrystalline silicon polished wafers
Issued on: 1996-11-04 Price(USD): 130.0 |
GB/T 12964-2003 Monocrystalline silicon polished wafers
Issued on: 2003-6-1 Price(USD): 150.0 |
GB/T 12964-2018 Monocrystalline silicon polished wafers
Issued on: 2018-09-17 Price(USD): 160.0 |
GB/T 12965-1996 Monocrystalline silicon as cut slices and lapped slices
Issued on: 1996-01-01 Price(USD): 100.0 |
GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices
Issued on: 2005-9-19 Price(USD): 120.0 |
GB/T 12965-2018 Monocrystalline silicon as cut wafers and lapped wafers
Issued on: 2018-09-17 Price(USD): 160.0 |
GB/T 13387-2009 Test method for measuring flat length wafers of silicon and other electronic materials
Issued on: 2009-10-30 Price(USD): 150.0 |
GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques
Issued on: 2009-10-30 Price(USD): 180.0 |
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