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DB52/T 1104-2016 Junction-to-case thermal resistance transient test method of semiconductor devices
Issued on: 2016-04-01 Price(USD): |
GB/T 11499-2001 Letter symbols for discrete semiconductor devices
Issued on: 1989-03-03 Price(USD): 570.0 |
GB/T 12560-1999 Semiconductor devices --Sectional specification for discrete devices
Issued on: 1999-08-02 Price(USD): 240.0 |
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General
Issued on: 1998-01-01 Price(USD): 670.0 |
GB/T 20516-2006 Semiconductor devices - Discrete devices - Part 4: Microwave devices
Issued on: 2006-10-10 Price(USD): 90.0 |
GB/T 20521-2006 Semconductor devices Part 14-1: Semiconductor sensors - General and classification
Issued on: 2006-08-23 Price(USD): 90.0 |
GB/T 20522-2006 Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors
Issued on: 2006-08-23 Price(USD): 130.0 |
GB/T 20870.1-2007 Semiconductor devices-Part 16-1:Microwave integrated circuits-Amplifiers
Issued on: 2007-2-20 Price(USD): 450.0 |
GB/T 20870.2-2023 Semiconductor devices—Part 16-2: Microwave integrated circuits—Frequency prescalers
Issued on: 2023-9-7 Price(USD): 435.0 |
GB/T 20870.5-2023 Semiconductor devices—Part 16-5: Microwave integrated circuits—Oscillators
Issued on: 2023-9-7 Price(USD): 600.0 |
GB/T 249-2017 The rule of type designation for discrete semiconductor devices
Issued on: 2017-05-12 Price(USD): 70.0 |
GB/T 29332-2012 Semiconductor devices—Discrete devices—Part 9:Insulated-gate bipolar transistors (IGBT)
Issued on: 2012-12-31 Price(USD): 750.0 |
GB/T 4589.1-2006 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
Issued on: 2006-10-10 Price(USD): 420.0 |
GB/T 4937.11-2018 Semiconductor devices—Mechanical and climatic test methods—Part 11:Rapid change of temperature—Two-fluid-bath method
Issued on: 2018-09-17 Price(USD): 80.0 |
GB/T 4937.12-2018 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Issued on: 2018-09-17 Price(USD): 80.0 |
GB/T 4937.13-2018 Semiconductor devices—Mechanical and climatic test methods—Part 13:Salt atmosphere
Issued on: 2018-09-17 Price(USD): 80.0 |
GB/T 4937.14-2018 Semiconductor devices—Mechanical and climatic test methods—Part 14:Robustness of terminations(lead integrity)
Issued on: 2018-09-17 Price(USD): 160.0 |
GB/T 4937.15-2018 Semiconductor devices—Mechanical and climatic test methods—Part 15:Resistance to soldering temperature for through-hole mounted devices
Issued on: 2018-09-17 Price(USD): 80.0 |
GB/T 4937.17-2018 Semiconductor devices—Mechanical and climatic test methods—Part 17:Neutron irradiation
Issued on: 2018-09-17 Price(USD): 80.0 |
GB/T 4937.18-2018 Semiconductor devices—Mechanical and climatic test methods—Part 18:Ionizing radiation(total dose)
Issued on: 2018-09-17 Price(USD): 130.0 |
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