| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| DB37/T 3142-2018 |
Technical regulation of Phased-array Ultrasonic Testing for welded joints of small diameter pipe |
|
via email in business day |
valid,,2018-3-13 |
|
| DB37/T 3143-2018 |
Technical regulation of Phased-array Ultrasonic Testing for socket welded joints of small diameter pipe |
|
via email in business day |
valid,,2018-3-13 |
|
| DB37/T 3589-2019 |
Remanufacturing Test sample preparation method for bonding strength of laser cladding layer and substrate |
|
via email in business day |
valid,,2019-6-29 |
|
| DB37/T 3590-2019 |
Remanufacturing Test method for bonding strength of laser cladding layer and substrate |
|
via email in business day |
valid,,2019-6-29 |
|
| DB37/T 4360-2021 |
The technical code of Phased-array Ultrasonic Testing of welded joints of medium and large diameter pipes |
$405.00 |
via email in 1~5 business day |
valid,,2021-4-11 |
|
| DB37/T 4361-2021 |
The technical code of Phased-array Ultrasonic Testing for inspecting bolts |
$300.00 |
via email in 1~5 business day |
valid,,2021-4-11 |
|
| DL/T 999-2006 |
The gradational standard of spheroidizition for 2.25Cr-1Mo steel used in power plant |
$240.00 |
via email in 1~3 business day |
valid,,2006-10-1 |
|
| GB/T 10567.2-2007 |
Wrought copper and copper alloys—Detection of residual stress—Ammonia test |
$140.00 |
immediately |
valid,,2008-4-1 |
|
| GB/T 11073-2007 |
Standard method for measuring radial resistivity variation on silicon slices |
$210.00 |
via email in 1~3 business day |
valid,,2008-2-1 |
|
| GB/T 13925-2010 |
Metallographs for high manganese cast steel |
$60.00 |
immediately |
valid,,2011-6-1 |
|
| GB/T 14140.2-1993 |
Silicon slices and wafers-Measuring of diameter-Micrometer method |
$184.00 |
via email in 1~3 business day |
abolished2010-06-01,2010-6-1,1993-10-1 |
|
| GB/T 1550-1997 |
methods for measuring conductivity type of extrinsic semiconducting materials |
$120.00 |
via email in 1~3 business day |
superseded,2019-11-1,1997-1-2 |
|
| GB/T 1553-1997 |
Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay |
$240.00 |
via email in 1~3 business day |
abolished2010-06-01,2010-6-1,1997-1-2 |
|
| GB/T 15615-1995 |
Test method for measuring flexture strength of silicon slices |
$340.00 |
via email in 1~3 business day |
abolished2005-10-14 ,,1996-2-1 |
|
| GB/T 16481-1996 |
STANDARD spectrum tables of microwave plasma torch-atomic emitting spectrum of rare earth |
$210.00 |
via email in 1~3 business day |
abolished2017-12-15,,1997-1-1 |
|
| GB/T 17473.1-1998 |
Test methods of precious metal pastes used for thick film microelectronics--Determination of solids content |
$60.00 |
via email in 1~3 business day |
abolished2008-09-01,2008-9-1,1999-3-1 |
|
| GB/T 17473.2-1998 |
Test methods of precious metal pastes used for thick film microelectronics--Determination of fineness |
$60.00 |
via email in 1~3 business day |
abolished2008-09-01,2008-9-1,1999-3-1 |
|
| GB/T 17473.3-1998 |
Test methods of precious metal pastes used for thick film microelectronics--Determination of sheet resistance |
$90.00 |
via email in 1~3 business day |
abolished2008-09-01,2008-9-1,1999-3-1 |
|
| GB/T 17473.4-1998 |
Test methods of precious metal pastes used for thick film microelectronics--Determination of adhesion |
$75.00 |
via email in 1~3 business day |
abolished2008-09-01,2008-9-1,1999-3-1 |
|
| GB/T 17473.5-1998 |
Test methods of precious metal pastes used for thick film microelectronics--Determination of viscosity |
$60.00 |
via email in 1~3 business day |
abolished2008-09-01,2008-9-1,1999-3-1 |
|
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