2025-12-5 216.73.216.21
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
GB/T 13584-1992 Measuring methods for parameters of infrared detectors 330.0 via email in 1~5 business day superseded2012-07-01,2012-7-1,1993-5-1
SJ 20574-1996 General specification for instrument landing system (ILS) marker beacon 240.0 via email in 1~3 business day valid,,1997-1-1
SJ 20831-2002 Method for measurement and test of parameters of 4N infrared focal plane detector dewar assembly 150.0 via email in 1~3 business day valid,,2003-3-1
SJ 20955-2006 Indicators fault locating general specification for 210.0 via email in 1~3 business day valid,,2006-12-30
GB/T 13584-2011 Measuring methods for paramaters of infrared detectors 480.0 via email in 1~3 business day valid,,2012-7-1
GB/T 13583-1992 Outline dimension series of infrared detectors 480.0 via email in 1~3 business day valid,,1993-5-1
SJ 20830-2002 General specification for PtSi infrared focal plane arrays detector-dewar assembly 180.0 via email in 1~3 business day valid,,2003-3-1
GB/T 18904.1-2002 Semiconductor devices - Part 12-1: Optoelectronic devices-Blank detail specification for light emitting/infrared emitting diodes with/without pigtail for fiber optic systems or sub 150.0 via email in 1~3 business day valid,,2003-5-1
QJ 2462-1993 285.0 via email in 1~3 business day valid,,1991-6-10
DL/T 664-2008 Application rules of infrared diagnosis for live electrical equipment 300.0 via email in 1~3 business day superseded2017-05-01,2017-5-1,2008-11-1
GB/T 17444-2013 Measuring methods for parameters of infrared focal plane arrays 390.0 via email in 1~3 business day valid,,2014-4-15
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GB/T 13584-1992 Measuring methods for parameters of infrared detectors 
  Issued on: 1992-07-15   Price(USD): 330.0
SJ 20574-1996 General specification for instrument landing system (ILS) marker beacon 
  Issued on: 1996-8-30   Price(USD): 240.0
SJ 20831-2002 Method for measurement and test of parameters of 4N infrared focal plane detector dewar assembly 
  Issued on: 2002-10-30   Price(USD): 150.0
SJ 20955-2006 Indicators fault locating general specification for 
  Issued on: 2006-8-7   Price(USD): 210.0
GB/T 13584-2011 Measuring methods for paramaters of infrared detectors 
  Issued on: 2011-12-30   Price(USD): 480.0
GB/T 13583-1992 Outline dimension series of infrared detectors 
  Issued on: 1992-07-15   Price(USD): 480.0
SJ 20830-2002 General specification for PtSi infrared focal plane arrays detector-dewar assembly 
  Issued on: 2002-10-30   Price(USD): 180.0
GB/T 18904.1-2002 Semiconductor devices - Part 12-1: Optoelectronic devices-Blank detail specification for light emitting/infrared emitting diodes with/without pigtail for fiber optic systems or sub  
  Issued on: 2002-12-1   Price(USD): 150.0
QJ 2462-1993  
  Issued on: 1993-03-20   Price(USD): 285.0
DL/T 664-2008 Application rules of infrared diagnosis for live electrical equipment 
  Issued on: 2008-6-4   Price(USD): 300.0
GB/T 17444-2013 Measuring methods for parameters of infrared focal plane arrays 
  Issued on: 2013-11-12   Price(USD): 390.0
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