2024-11-22 18.116.86.160
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
DB31/ 652-2012 The norm of energy consumption per unit information flow of communications industry(The part of mobile communications macro base station and data center) 165.0 via email in 1~3 business day valid,,2013-2-1
DB31/ 653-2012 165.0 via email in 1~3 business day valid,,2013-2-1
SJ 1553-1980 General specification for negative temperature coefficient thermistors for temperature measurement 544.0 via email in 1~3 business day superseded,1987-8-1,1980-10-1
SJ 1557-1980 General specification for indirectly heated temperature coefficient themistors 180.0 via email in 1~3 business day superseded,1992-5-1,1980-10-1
SJ 2028-1982 Generic specification for directly heated positive temperature coefficient thermistors 180.0 via email in 1~3 business day valid,,1982-9-1
SJ 2028.1-1983 Directly heated positive temperature coefficient thermistors used for temperature compensation for Type MZ11 90.0 via email in 1~3 business day valid,,1983-10-1
SJ 2028.2-1983 Positive temperature coefficient thermistors used for temperature control for Type MZ61 120.0 via email in 1~3 business day valid,,1983-10-1
SJ 2214.1-1982 General procedures of measurement for semiconductor photodiodes and phototransistors 184.0 via email in 1~3 business day abolished2015-10-01,2015-10-1,1983-7-1
SJ 2214.10-1982 Method of measurement for light current of semiconductor photodiodes and phototransistors 184.0 via email in 1~3 business day abolished2015-10-01,2015-10-1,1983-7-1
SJ 2214.2-1982 Method of measurement for forward voltage of semiconductor photodiodes 184.0 via email in 1~3 business day abolished2015-10-01,2015-10-1,1983-7-1
SJ 2214.3-1982 Method of measurement for dark current of semiconductor photodiodes 184.0 via email in 1~3 business day abolished2015-10-01,2015-10-1,1983-7-1
SJ 2214.4-1982 Method of measurement for reverse break-down voltage of semiconductor photodiodes 184.0 via email in 1~3 business day superseded2015-10-01,2015-10-1,1983-7-1
SJ 2214.5-1982 Method of measurement for junction capacitance of semiconductor photodiodes 184.0 via email in 1~3 business day superseded2015-10-01,2015-10-1,1983-7-1
SJ 2214.6-1982 Method of measurement for collector-emitter reverse breakdown voltage of semiconductor phototransistors 184.0 via email in 1~3 business day abolished2015-10-01,2015-10-1,1983-7-1
SJ 2214.7-1982 Method of measurement for saturation voltage of semiconductor phototransistors 184.0 via email in 1~3 business day superseded2015-10-01,2015-10-1,1983-7-1
SJ 2214.8-1982 Method of measurement for dark current voltage of semiconductor phototransistors 184.0 via email in 1~3 business day superseded2015-10-01,2015-10-1,1983-7-1
SJ 2214.9-1982 Method of measurement for pulse rise and fall time of semiconductor photodiodes and phototransistors 184.0 via email in 1~3 business day superseded2015-10-01,2015-10-1,1983-7-1
SJ 2215.1-1982 General procedures of measurement for semiconductor photocouplers 184.0 via email in 1~3 business day superseded2015-10-01,2015-10-1,1983-7-1
SJ 2215.10-1982 Method of measurement for direct current transfer ratio of semiconductor photocouplers 184.0 via email in 1~3 business day superseded2015-10-01,2015-10-1,1983-7-1
SJ 2215.11-1982 Method of measurement for pulse rise fall delay and storage time of semiconductor photocouplers 184.0 via email in 1~3 business day superseded2015-10-01,2015-10-1,1983-7-1
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DB31/ 652-2012 The norm of energy consumption per unit information flow of communications industry(The part of mobile communications macro base station and data center) 
  Issued on: 2012-10-19   Price(USD): 165.0
DB31/ 653-2012  
  Issued on: 2012-10-19   Price(USD): 165.0
SJ 1553-1980 General specification for negative temperature coefficient thermistors for temperature measurement 
  Issued on: 1980-02-04   Price(USD): 544.0
SJ 1557-1980 General specification for indirectly heated temperature coefficient themistors 
  Issued on: 1980-02-04   Price(USD): 180.0
SJ 2028-1982 Generic specification for directly heated positive temperature coefficient thermistors 
  Issued on: 1982-01-30   Price(USD): 180.0
SJ 2028.1-1983 Directly heated positive temperature coefficient thermistors used for temperature compensation for Type MZ11 
  Issued on: 1983-02-24   Price(USD): 90.0
SJ 2028.2-1983 Positive temperature coefficient thermistors used for temperature control for Type MZ61 
  Issued on: 1983-02-24   Price(USD): 120.0
SJ 2214.1-1982 General procedures of measurement for semiconductor photodiodes and phototransistors 
  Issued on: 1982-11-30   Price(USD): 184.0
SJ 2214.10-1982 Method of measurement for light current of semiconductor photodiodes and phototransistors 
  Issued on: 1982-11-30   Price(USD): 184.0
SJ 2214.2-1982 Method of measurement for forward voltage of semiconductor photodiodes 
  Issued on: 1982-11-30   Price(USD): 184.0
SJ 2214.3-1982 Method of measurement for dark current of semiconductor photodiodes 
  Issued on: 1982-11-30   Price(USD): 184.0
SJ 2214.4-1982 Method of measurement for reverse break-down voltage of semiconductor photodiodes 
  Issued on: 1982-11-30   Price(USD): 184.0
SJ 2214.5-1982 Method of measurement for junction capacitance of semiconductor photodiodes 
  Issued on: 1982-11-30   Price(USD): 184.0
SJ 2214.6-1982 Method of measurement for collector-emitter reverse breakdown voltage of semiconductor phototransistors 
  Issued on: 1982-11-30   Price(USD): 184.0
SJ 2214.7-1982 Method of measurement for saturation voltage of semiconductor phototransistors 
  Issued on: 1982-11-30   Price(USD): 184.0
SJ 2214.8-1982 Method of measurement for dark current voltage of semiconductor phototransistors 
  Issued on: 1982-11-30   Price(USD): 184.0
SJ 2214.9-1982 Method of measurement for pulse rise and fall time of semiconductor photodiodes and phototransistors 
  Issued on: 1982-11-30   Price(USD): 184.0
SJ 2215.1-1982 General procedures of measurement for semiconductor photocouplers 
  Issued on: 1982-11-30   Price(USD): 184.0
SJ 2215.10-1982 Method of measurement for direct current transfer ratio of semiconductor photocouplers 
  Issued on: 1982-11-30   Price(USD): 184.0
SJ 2215.11-1982 Method of measurement for pulse rise fall delay and storage time of semiconductor photocouplers 
  Issued on: 1982-11-30   Price(USD): 184.0
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