Standard No.:	GB/T 17025-1997
English Name:	Potentiometers for use in electronic equipment Part 4: Sectional specification Single-turn rotary power potentiometers
Chinese Name:	电子设备用电位器 第4部分:分规范 单圈旋转功率电位器
Chinese Classification:	L14    Potentiometer
Professional Classification:	GB    National Standard
ICS Classification:	31.040.20 31.040.20    Potentiometers, variable resistors 31.040.20
Issued by:	CSBTS
Issued on:	1997-10-7
Implemented on:	1998-9-1
Status:	valid
Superseding:	SJ 2898-1988
Language:	English
File Format:	PDF
Word Count:	8000 words
Price(USD):	240.0
Delivery:	via email in 1 business day

Potentiometers for use in electronic equipment - Part 4: Sectional specification - Single-turn rotary power potentiometers Section 1 General 1 General 1.1 Scope This standard is applicable to single-turn rotary power potentiometers. These potentiometers are primarily intended for use in electronic equipment. 1.2 Object The object of this standard is to prescribe preferred ratings and characteristics and to select from GB/T 15298-94 Potentiometers for use in electronic equipment - Part 1: Generic specification appropriate quality assessment procedures, tests and measuring methods and to give general performance requirements for this type of potentiometer. Test severities and requirements prescribed in detail specifications referring to this standard shall be of equal or higher performance level, lower performance levels are not permitted. 1.3 Related documents GB/T 2471-1995 Preferred number series for resistors and capacitors (IDT: IEC 63: 1977) GB/T 15298-94 Potentiometers for use in electronic equipment - Part 1: Generic specification (IDT: IEC 393-1: 1989) IEC 68 Basic environmental testing procedures IEC 410 (1973) Sampling plans and procedures for inspection by attributes IEC 915 (1987) Capacitors and resistors for electronic equipment; preferred dimensions of spindle ends, bushes and for the mounting of single-hole, bush-mounted, spindle-operated electronic components IECQ/QC 001001 (1986) Basic rules of the IEC quality assessment system for electronic component (IECQ) IECQ/QC 001002 (1986) Rules of procedure of the IEC quality assessment system for electronic components (IECQ) Note: The above standards apply to the current editions except for IEC 68, for which the specified edition in the corresponding test clauses of the generic specification shall be used. 1.4 Information to be given in a detail specification Detail specifications shall be derived from the relevant blank detail specification. Detail specifications shall not specify requirements inferior to those of the generic, sectional or blank detail specification. When more severe requirements are included, they shall be listed in Sub-clause 1.9 of the detail specification and indicated in the test schedules, for example by an Asterisk. Note: The information given in Sub-clauses 1.4.1 and 1.4.3 may, for convenience, be presented in tabular form. The following information shall be given in each detail specification and the values quoted shall preferably be selected from those given in the relevant clause of this Standard. 1.4.1 Outline drawing and dimensions The detail specification shall incorporate an outline drawing of the potentiometer being specified. Where space is insufficient to show the detail dimensions required for inspection purposes, such dimensions shall appear on a drawing in an annex to the detail specification.

Contents Foreword i IEC Foreword ii IEC Preface iii Section 1 General Section 2 Preferred ratings, characteristics and test severities Section 3 Quality evaluation procedure