2025-12-24 216.73.216.41
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Code of China
Chinese National Standard List: Technical management

SJ 2354.12-1983 Method of measurement for temperature factor of reverse breakdown voltage of PIN and avalanche photodiodes 
  Issued on: 1983-08-15   Translation Price(USD): 30.0
SJ 2354.6-1983 Method of measurement for responsivity of PIN and avalanche photodiodes 
  Issued on: 1983-08-15   Translation Price(USD): 184.0
SJ 2354.4-1983 Method of measurement for forward voltage drop of PIN and avalanche photodiodes 
  Issued on: 1983-08-15   Translation Price(USD): 184.0
SJ 2355.4-1983 Methods of measurement for junction capacitance of light-emitting devices 
  Issued on: 1983-08-15   Translation Price(USD): 180.0
SJ 2354.9-1983 Method of measurement for noise equivalent power of PIN and avalanche photodiodes 
  Issued on: 1983-08-15   Translation Price(USD): 184.0
SJ 2354.2-1983 Method of measurement for reverse break-down voltage of PIN and avalanche photodiodes 
  Issued on: 1983-8-15   Translation Price(USD): 184.0
SJ 2354.5-1983 Method of measurement for capacitance of PIN and avalanche photodiodes 
  Issued on: 1983-08-15   Translation Price(USD): 184.0
SJ 2355.6-1983 Method of measurement for luminous flux of light-emitting devices 
  Issued on: 1983-08-15   Translation Price(USD): 180.0
SJ 2354.8-1983 Method of measurement for pulse rise time and fall time of PIN and avalanche photodiodes 
  Issued on: 1983-08-15   Translation Price(USD): 184.0
SJ 2355.5-1983 Method of measurement for luminous intensity and half-intensity angle of light-emitting devices 
  Issued on: 1983-08-15   Translation Price(USD): 180.0
SJ 2354.14-1983 Method of measurement for excess noise factor of PIN and avalanche photodiodes 
  Issued on: 1983-8-15   Translation Price(USD): 184.0
SJ 2354.10-1983 Method of measurement for cross-light factor of PIN and avalanche photodiodes matrix 
  Issued on: 1983-8-15   Translation Price(USD): 184.0
SJ 2354.3-1983 Method of measurement for dark current of PIN and avalanche photodiodes 
  Issued on: 1983-8-15   Translation Price(USD): 184.0
SJ 2354.7-1983 Method of measurement for spectral response curve and spectral response range of PIN and avalanche photodiodes 
  Issued on: 1983-8-15   Translation Price(USD): 184.0
SJ 2354.11-1983 Method of measurement for width of blind zone of PIN and avalanche photodiode matrix 
  Issued on: 1983-08-15   Translation Price(USD): 184.0
SJ 2355.1-1983 General procedures of measurement for light-emitting deivces 
  Issued on: 1983-08-15   Translation Price(USD): 180.0
SJ 2354.1-1983 General procedures of measurement for electrical and optical parameters of PIN and avalanche photodiodes 
  Issued on: 1983-08-15   Translation Price(USD): 184.0
SJ 2355.3-1983 Method of measurement for reverse current of light-emitting devices 
  Issued on: 1983-08-15   Translation Price(USD): 180.0
SJ 2354.13-1983 Method of measurement for multiplication factor of PIN and avalanche photodiodes 
  Issued on: 1983-08-15   Translation Price(USD): 184.0
SJ 2355.2-1983 Method of measurement for forward voltage drop of light-emitting devices 
  Issued on: 1983-11-25   Translation Price(USD): 180.0
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