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| Position: Chinese Standard in English/SJ 2354.10-1983 |
| SJ 2354.10-1983 Method of measurement for cross-light factor of PIN and avalanche photodiodes matrix (English Version) | |||
| Standard No.: | SJ 2354.10-1983 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 1000 words | Translation Price(USD): | 184.0 remind me the price change |
| Implemented on: | 1984-7-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | SJ 2354.10-1983 |
| English Name: | Method of measurement for cross-light factor of PIN and avalanche photodiodes matrix |
| Chinese Name: | PIＮ、雪崩光电二极管列阵串光因子的测试方法 |
| Chinese Classification: | F01 Technical management |
| Professional Classification: | SJ Professional Standard - Electronics |
| Source Content Issued by: | MOEI |
| Issued on: | 1983-8-15 |
| Implemented on: | 1984-7-1 |
| Status: | superseded |
| Superseded by: | SJ/T 2354-2015 Measuring methods for photodiodes of PIN、APD |
| Superseded on: | 2015-10-1 |
| Target Language: | English |
| File Format: | |
| Word Count: | 1000 words |
| Translation Price(USD): | 184.0 |
| Delivery: | via email in 1~3 business day |