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| Chinese National Standard Category: Semiconductor integrated circuit |
| English Title: | Integrated circuits—Measurement of impulse immunity—Part 3: Non-synchronous transient injection method |
| Chinese Title: | 集成电路 脉冲抗扰度测量 第3部分：非同步瞬态注入法 |
| Standard No.: | GB/T 43034.3-2023 |
| Category No.: | L56 |
| Issued by: | SAMR; SAC |
| Issued on: | 2023-9-7 |
| Implemented on: | 2024-1-1 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 14500 words |
| Similar Standards: | T/SZAA 002-2024 GB/T 44807.1-2024 GB/T 44806.1-2024 GB/T 44801-2024 GB/T 44798-2024 GB/T 44795-2024 GB/T 44777-2024 GB/T 43034.2-2024 GB/T 42968.2-2024 GB/T 20870.4-2024 GB/T 42744-2023 GB/T 43034.3-2023 GB/T 42974-2023 GB/T 42975-2023 GB/T 42973-2023 GB/T 42970-2023 GB/T 42969-2023 GB/T 42968.8-2023 GB/T 42968.1-2023 GB/T 20870.5-2023 |
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