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| Chinese National Standard Category: Physics and Mechanics |
| English Title: | Nanotechnology—Determination of the uniformity of SERS solid substrate—Raman mapping analysis |
| Chinese Title: | 纳米技术 表面增强拉曼固相基片均匀性测量 拉曼成像分析法 |
| Standard No.: | GB/T 44075-2024 |
| Category No.: | A42 |
| Issued by: | SAMR; SAC |
| Issued on: | 2024-05-28 |
| Implemented on: | 2024-12-1 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 9500 words |
| Similar Standards: | GB/T 44234-2024 GB/T 44454-2024 GB/T 44075-2024 GB/T 44076-2024 GB/T 43845-2024 GB/T 43682-2024 GB/T 30544.12-2023 GB/T 42106-2022 GA/T 1727-2020 GB/T 30113.1-2013 GB/T 17754-2012 GB/T 25898-2010 GB/T 22458-2008 GB/T 18022-2000 GB/T 4854.4-1999 GB/T 4854.1-1999 GB/T 17696-1999 GB/T 4854.7-1999 GB/T 17754-1999 QJ 1293A-1998 |
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