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| Chinese National Standard Category: Semiconductor discrete devices in general |
| English Title: | Semiconductor devices—Stress migration test—Part 1: Copper stress migration test |
| Chinese Title: | 半导体器件 应力迁移试验 第1部分：铜应力迁移试验 |
| Standard No.: | GB/T 45721.1-2025 |
| Category No.: | L40 |
| Issued by: | SAMR; SAC |
| Issued on: | 2025-05-30 |
| Implemented on: | 2025-9-1 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 14500 words |
| Similar Standards: |
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