 |
Chinese Classification
Professional Classification
ICS Classification
Latest
Value-added Services
|
| Chinese National Standard Category: Semiconductor discrete devices in general |
| English Title: | Semiconductor devices—Mechanical and climatic test methods—Part 31:Flammability of platic-encapsulated devices（internally induced） |
| Chinese Title: | 半导体器件 机械和气候试验方法 第31部分：塑封器件的易燃性（内部引起的） |
| Standard No.: | GB/T 4937.31-2023 |
| Category No.: | L40 |
| Issued by: | SAMR; SAC |
| Issued on: | 2023-05-23 |
| Implemented on: | 2023-12-1 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 4000 words |
| Similar Standards: |
| Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886 |
| Copyright: Beijing COC Tech Co., Ltd. 2008-2020 |