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| Chinese National Standard Category: Nuclear instrument and detector in general |
| English Title: | Test procedures for semiconductor charged particle detectors |
| Chinese Title: | 带电粒子半导体探测器测试方法 |
| Standard No.: | GB/T 5201-1994 |
| Category No.: | F80 |
| Issued by: | AQSIQ |
| Issued on: | 1994-1-2 |
| Implemented on: | 1995-10-1 |
| Status: | superseded |
| Superseded by: | GB/T 5201-2012 GB/T 5201-2012 |
| Superseded on: | 2012-11-1 |
| Abolished on: | |
| Superseding: | GB 5201-1985 Test procedures for semiconductor charged particle detectors |
| Word Count: | 7000 words |
| Similar Standards: | GB/T 10257-1988 GB 12127-1989 GB/T 41991-2022 GB/T 41143-2021 GB/T 19661.2-2015 GB/T 2900.81-2008 GB/T 2900.82-2008 GB/T 10261-2008 GB/T 10263-2006 GB/T 19661.1-2005 GB/T 19661.2-2005 GB/T 11685-2003 GB/T 13181-2002 GB/T 10257-2001 GB/T 8993-1998 GB/T 10259-1988 GB/T 7167-1996 GB/T 5201-1994 GB/T 4079-1994 GB/T 12790-1991 |
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