2025-12-17 216.73.216.99
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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Standard No. Title Price(USD) Delivery Status Add to Cart
T/ZSA 231-2024 Test method for full width at half maximum of double crystal X-ray rocking curve of Ga2O3 single crystal substrate via email in business day valid,,2024-5-16
GB/T 14847-2025 Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates - Infrared reflectance method 195.0 via email in 1~3 business day to be valid,,2026-5-1
YS/T 273.2-2006 Chemical analysis methods and physical properties of cryolite—Part 2:Determination of ignition loss 105.0 via email in 1~3 business day to be superseded2026-03-01,2026-3-1,2006-12-1
YS/T 535.2-2009 Chemical analysis methods of sodium fluoride - Part 2: Determination of fluorine content - Distillation-thorium nitrate volumetric method 140.0 via email in 1~3 business day to be superseded,2026-3-1,2010-6-1
YS/T 581.5-2006 Determination of chemical contents and physical properties of aluminium fluoride Part 5:Determination of sodium by flame atomic absorption spectrometric method 145.0 via email in 1~3 business day to be superseded,2026-3-1,2006-8-1
YS/T 581.6-2006 Determination of chemical contents and physical properties of aluminium fluoride Part 6: Determination of silica content by the molybdenum blue photometric 145.0 via email in 1~3 business day to be superseded,2026-3-1,2006-8-1
YS/T 581.10-2006 Determination of chemical contents and physical properties of aluminium fluoride Part 10: Determination of sulphur content by X-ray fluorescence spectrometric method 60.0 via email in 1~3 business day valid,,2006-8-1
GB/T 46227-2025 Test method for transmittance of semiconductor single crystal materials 210.0 via email in 1~3 business day to be valid,,2026-3-1
GB/T 20831-2025 Method of test for the thermal endurance of surface insulation coatings of electrical sheet and strip 270.0 via email in 1~3 business day to be valid,,2026-3-1
GB/T 5161-2025 Metallic powder—Determination of effective density—Liquid immersion method 270.0 via email in 1~3 business day to be valid,,2026-3-1
GB/T 19444-2025 Test method for oxygen precipition characteristics of silicon wafers—Interstitial oxygen reduction 210.0 via email in 1~3 business day to be valid,,2026-1-1
GB/T 6148-2025 Test method for temperature-resistance coefficient of precision resistance alloys 210.0 via email in 1~3 business day valid,,2025-11-1
GB/T 6147-2025 Test method for thermoelectric power of precision resistance alloys 210.0 via email in 1~3 business day valid,,2025-11-1
GB/T 41079.3-2024 Test methods for physical properties of liquid metals—Part 3: Determination of viscosity 210.0 via email in 1~3 business day valid,,2025-5-1
GB/T 44558-2024 Test method for dislocation imaging in III-nitride semiconductor materials—Transmission electron microscopy 270.0 via email in 1~3 business day valid,,2025-4-1
GB/T 44371-2024 Critical bending diameter measurement—Critical bending diameter measurement of Bi-2223 superconducting wires in liquid nitrogen temperature 315.0 via email in 1~5 business day valid,,2025-3-1
GB/T 44330-2024 Lithium-ion battery cathode materials—Determination of powder compaction density 210.0 via email in 1~3 business day valid,,2025-3-1
GB/T 24578-2024 Test method for measuring surface metal contamination on semiconductor wafers - Total reflection X-Ray fluorescence spectroscopy 315.0 via email in 1~5 business day valid,,2025-2-1
GB/T 43894.1-2024 Practice for determining semiconductor wafer near-edge geometry—Part 1:Measured height data array using a curvature metric（ZDD） 195.0 via email in 1~3 business day valid,,2024-11-1
GB/T 8758-1988 Measuring thickness of epitaxial layers of gallium arsenide by infrared interference 60.0 via email in 1~3 business day valid,,1989-2-1
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T/ZSA 231-2024 Test method for full width at half maximum of double crystal X-ray rocking curve of Ga2O3 single crystal substrate 
  Issued on: 2024-05-15   Price(USD):
GB/T 14847-2025 Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates - Infrared reflectance method 
  Issued on: 2025-10-31   Price(USD): 195.0
YS/T 273.2-2006 Chemical analysis methods and physical properties of cryolite—Part 2:Determination of ignition loss 
  Issued on: 2006-5-25   Price(USD): 105.0
YS/T 535.2-2009 Chemical analysis methods of sodium fluoride - Part 2: Determination of fluorine content - Distillation-thorium nitrate volumetric method 
  Issued on: 2009-12-4   Price(USD): 140.0
YS/T 581.5-2006 Determination of chemical contents and physical properties of aluminium fluoride Part 5:Determination of sodium by flame atomic absorption spectrometric method 
  Issued on: 2006-3-7   Price(USD): 145.0
YS/T 581.6-2006 Determination of chemical contents and physical properties of aluminium fluoride Part 6: Determination of silica content by the molybdenum blue photometric 
  Issued on: 2006-3-7   Price(USD): 145.0
YS/T 581.10-2006 Determination of chemical contents and physical properties of aluminium fluoride Part 10: Determination of sulphur content by X-ray fluorescence spectrometric method 
  Issued on: 2006-3-7   Price(USD): 60.0
GB/T 46227-2025 Test method for transmittance of semiconductor single crystal materials 
  Issued on: 2025-8-29   Price(USD): 210.0
GB/T 20831-2025 Method of test for the thermal endurance of surface insulation coatings of electrical sheet and strip 
  Issued on: 2025-8-29   Price(USD): 270.0
GB/T 5161-2025 Metallic powder—Determination of effective density—Liquid immersion method 
  Issued on: 2025-8-29   Price(USD): 270.0
GB/T 19444-2025 Test method for oxygen precipition characteristics of silicon wafers—Interstitial oxygen reduction 
  Issued on: 2025-06-30   Price(USD): 210.0
GB/T 6148-2025 Test method for temperature-resistance coefficient of precision resistance alloys 
  Issued on: 2025-04-25   Price(USD): 210.0
GB/T 6147-2025 Test method for thermoelectric power of precision resistance alloys 
  Issued on: 2025-04-25   Price(USD): 210.0
GB/T 41079.3-2024 Test methods for physical properties of liquid metals—Part 3: Determination of viscosity 
  Issued on: 2024-10-26   Price(USD): 210.0
GB/T 44558-2024 Test method for dislocation imaging in III-nitride semiconductor materials—Transmission electron microscopy 
  Issued on: 2024-09-29   Price(USD): 270.0
GB/T 44371-2024 Critical bending diameter measurement—Critical bending diameter measurement of Bi-2223 superconducting wires in liquid nitrogen temperature 
  Issued on: 2024-8-23   Price(USD): 315.0
GB/T 44330-2024 Lithium-ion battery cathode materials—Determination of powder compaction density 
  Issued on: 2024-8-23   Price(USD): 210.0
GB/T 24578-2024 Test method for measuring surface metal contamination on semiconductor wafers - Total reflection X-Ray fluorescence spectroscopy 
  Issued on: 2024-11-27   Price(USD): 315.0
GB/T 43894.1-2024 Practice for determining semiconductor wafer near-edge geometry—Part 1:Measured height data array using a curvature metric（ZDD） 
  Issued on: 2024-4-25   Price(USD): 195.0
GB/T 8758-1988 Measuring thickness of epitaxial layers of gallium arsenide by infrared interference 
  Issued on: 1988-02-25   Price(USD): 60.0
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