2025-12-21 216.73.216.41
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
YS/T 273.13-2006 Chemical analysis methods and physical properties of cryolite - Part 13: Preparation and storage of test samples 60.0 via email in 1~3 business day valid,,2006-12-1
YS/T 273.3-2006 Chemical analysis methods and physical properties of cryolite - Part 3: Determination of fluoride content by distillation-thorium nitrate titration 90.0 via email in 1~3 business day superseded,2012-11-1,2006-12-1
YS/T 273.6-2006 Chemical analysis methods and physical properties of cryolite—Part 6:Determination of silica content by the molybdenum blue photometric 90.0 via email in 1~3 business day superseded,2024-7-1,2006-12-1
GB/T 8757-2006 Determination of carrier concentration in galliumarsenide by the plasma resonance minimum 95.0 via email in 1~3 business day valid,,2006-11-1
YB/T 4148-2006 Measurement method for magnetic property of small single sheet sample of electrical strip 160.0 via email in 1~3 business day valid,,2006-11-1
GB/T 5163-2006 Sintered metal materials, excluding hardmetals - Permeable sintered metal materials - Determination of density, oil content, and open porosity 110.0 via email in 1~3 business day valid,,2006-11-1
GB/T 8758-2006 Measuring thickness of epitaxial layers of gallium arsenide by infrared interference 60.0 via email in 1~3 business day valid,,2006-11-1
GB/T 1557-2006 The method of determining interstitial oxygen content in silicon by infrared absorption 304.0 via email in 1~3 business day superseded,2019-6-1,2006-11-1
GB/T 4326-2006 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient 210.0 via email in 1~3 business day to be abolished2026-05-01,2026-5-1,2006-11-1
GB/T 11068-2006 Gallium arsenide epitaxial layer - determination of carrier concentration voltage-capacitance method 120.0 via email in 1~3 business day valid,,2006-11-1
GB/T 5252-2006 Germanium monocrystal - inspection of dislocation etch pit density 100.0 via email in 1~3 business day abolished2021-04-01,2021-5-1,2006-11-1
YB/T 5360-2006 Metal materials -- Quantitative pole figure preparing method 120.0 via email in 1~3 business day valid,,2006-10-11
YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer 85.0 via email in 1~3 business day valid,,2006-10-11
YS/T 533-2006 Self-fluxing alloy powders-Determination of solidus-Liquidus temperature range 85.0 via email in 1~3 business day superseded,2025-11-1,2006-10-11
YB/T 5320-2006 Metal materials -- Quantitative phase analysis -- Value K method of X-ray diffraction 140.0 via email in 1~3 business day valid,,2006-10-11
YB/T 5321-2006 Determination of hermeticity of expansion alloys 85.0 via email in 1~3 business day valid,,2006-10-11
YS/T 516-2006 Determination method for secondary recrystallization temperature of tungsten wire 184.0 via email in 1~3 business day superseded,2012-11-1,2006-10-11
YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer 140.0 via email in 1~3 business day valid,,2006-10-11
YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer 95.0 via email in 1~3 business day superseded,2020-7-1,2006-10-11
YB/T 5350-2006 Metallic material - Standard test method for the elastic modulus at high temperature - The method of disc - Vibrator 160.0 via email in 1~3 business day valid,,2006-10-11
Previous Page     Next Page



Code of China
Search

YS/T 273.13-2006 Chemical analysis methods and physical properties of cryolite - Part 13: Preparation and storage of test samples 
  Issued on: 2006-5-25   Price(USD): 60.0
YS/T 273.3-2006 Chemical analysis methods and physical properties of cryolite - Part 3: Determination of fluoride content by distillation-thorium nitrate titration 
  Issued on: 2006-5-25   Price(USD): 90.0
YS/T 273.6-2006 Chemical analysis methods and physical properties of cryolite—Part 6:Determination of silica content by the molybdenum blue photometric 
  Issued on: 2006-5-25   Price(USD): 90.0
GB/T 8757-2006 Determination of carrier concentration in galliumarsenide by the plasma resonance minimum 
  Issued on: 2006-07-18   Price(USD): 95.0
YB/T 4148-2006 Measurement method for magnetic property of small single sheet sample of electrical strip 
  Issued on: 2006-5-12   Price(USD): 160.0
GB/T 5163-2006 Sintered metal materials, excluding hardmetals - Permeable sintered metal materials - Determination of density, oil content, and open porosity 
  Issued on: 2006-07-18   Price(USD): 110.0
GB/T 8758-2006 Measuring thickness of epitaxial layers of gallium arsenide by infrared interference  
  Issued on: 2006-7-18   Price(USD): 60.0
GB/T 1557-2006 The method of determining interstitial oxygen content in silicon by infrared absorption 
  Issued on: 2006-7-18   Price(USD): 304.0
GB/T 4326-2006 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient 
  Issued on: 2006-7-18   Price(USD): 210.0
GB/T 11068-2006 Gallium arsenide epitaxial layer - determination of carrier concentration voltage-capacitance method 
  Issued on: 2006-7-18   Price(USD): 120.0
GB/T 5252-2006 Germanium monocrystal - inspection of dislocation etch pit density  
  Issued on: 2006-7-18   Price(USD): 100.0
YB/T 5360-2006 Metal materials -- Quantitative pole figure preparing method 
  Issued on: 2006-7-27   Price(USD): 120.0
YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer 
  Issued on: 2006-7-27   Price(USD): 85.0
YS/T 533-2006 Self-fluxing alloy powders-Determination of solidus-Liquidus temperature range 
  Issued on: 2006-7-27   Price(USD): 85.0
YB/T 5320-2006 Metal materials -- Quantitative phase analysis -- Value K method of X-ray diffraction 
  Issued on: 2006-7-27   Price(USD): 140.0
YB/T 5321-2006 Determination of hermeticity of expansion alloys 
  Issued on: 2006-7-27   Price(USD): 85.0
YS/T 516-2006 Determination method for secondary recrystallization temperature of tungsten wire 
  Issued on: 2006-7-27   Price(USD): 184.0
YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer 
  Issued on: 2006-7-27   Price(USD): 140.0
YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer 
  Issued on: 2006-7-27   Price(USD): 95.0
YB/T 5350-2006 Metallic material - Standard test method for the elastic modulus at high temperature - The method of disc - Vibrator 
  Issued on: 2006-7-27   Price(USD): 160.0
About Us   |    Contact Us   |    Terms of Service   |    Privacy   |    Cancellation & Refund Policy   |    Payment
Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886
Copyright: Beijing COC Tech Co., Ltd. 2008-2040