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SJ 2286-1983 Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Type 3DG147 $180.00 via email in 1~3 business day abolished
SJ 2287-1983 Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Tuype 3DG148 $180.00 via email in 1~3 business day abolished
SJ 2288-1983 Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Type 3DG149 $180.00 via email in 1~3 business day abolished
SJ 2289-1983 Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Type 3DG151 $180.00 via email in 1~3 business day abolished
SJ 2290-1983 Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Type 3DG151 $180.00 via email in 1~3 business day abolished
SJ 2291-1983 Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Type 3DG153 $180.00 via email in 1~3 business day abolished
SJ 2292-1983 Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Type 3DG154 $180.00 via email in 1~3 business day abolished
SJ 2293-1983 Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Type 3DG155 $180.00 via email in 1~3 business day abolished
SJ 2294-1983 Detail specification for silicon NPN epitaxial planar superhigh frequency low noise low power transistors, Type 3DG156 $180.00 via email in 1~3 business day abolished
SJ 2354.1-1983 General procedures of measurement for electrical and optical parameters of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.10-1983 Method of measurement for cross-light factor of PIN and avalanche photodiodes matrix $184.00 via email in 1~3 business day superseded
SJ 2354.11-1983 Method of measurement for width of blind zone of PIN and avalanche photodiode matrix $184.00 via email in 1~3 business day superseded
SJ 2354.12-1983 Method of measurement for temperature factor of reverse breakdown voltage of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.13-1983 Method of measurement for multiplication factor of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.14-1983 Method of measurement for excess noise factor of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.2-1983 Method of measurement for reverse break-down voltage of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.3-1983 Method of measurement for dark current of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.4-1983 Method of measurement for forward voltage drop of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.5-1983 Method of measurement for capacitance of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.6-1983 Method of measurement for responsivity of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
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