2025-12-16 216.73.216.89
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
JB/T 9320-1999 Plane-gratings spectrographs 380.0 via email in 1~3 business day abolished2010-01-20 ,,2000-1-1
JB/T 11145-2011 X-ray fluorescence spectrometer 120.0 via email in 1~3 business day valid,,2012-4-1
JB/T 9325-1999 Spectrophotometer series and its basic parameter 220.0 via email in 1~3 business day abolished2017-05-12 ,,2000-1-1
JB/T 5590-1991 Optical Filter of Optical Spectrum Instrument 224.0 via email in 1~3 business day valid,,1992-7-1
GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis 100.0 via email in 1~3 business day to be superseded,2026-3-1,2003-6-1
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA) 120.0 via email in 1~3 business day valid,,2003-6-1
JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer 120.0 via email in 1~3 business day valid,,1992-7-1
GB 7667-1996 The dose of X-rays leakage from electron microscope 184.0 via email in 1~3 business day superseded2004-05-01,2004-5-1,1996-12-1
JB/T 5592-1991 V-Prism refractometer 204.0 via email in 1~3 business day superseded2025-05-01,2025-5-1,1992-7-1
GB/T 15247-1994 Electron probe quantitative analysis method of carbon in carbon steel and low alloy steel-Sensitivity curve method (detection limit method) 264.0 via email in 1~3 business day superseded2009-04-01,2009-4-1,1995-6-1
JB/T 5383-1991 Specification for Transmission Electron Microscope 244.0 via email in 1~3 business day abolished2017-05-12 ,,1992-7-1
JB/T 8235-1999 Monochromator 260.0 via email in 1~3 business day abolished2010-01-20 ,,2000-1-1
GB/T 26533-2011 General rules for Auger electron spectroscopic analysis 210.0 via email in 1~3 business day valid,,2011-12-1
GB/T 15247-2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using calibration curve method 220.0 via email in 1~3 business day valid,,2009-4-1
GB/T 15074-1994 General guide for EPMA quantitative analysis 150.0 via email in 1~3 business day superseded2009-03-01,2009-3-1,1994-1-2
JB/T 7399-1994 Collimator 120.0 via email in 1~3 business day superseded2025-05-01,2025-5-1,1995-5-1
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution 60.0 via email in 1~3 business day abolished2017-05-12 ,,1992-7-1
JB/T 6841-1993 Terminology of Electronic Optical Instrument 210.0 via email in 1~3 business day abolished2017-05-12 ,,1994-1-1
JB/T 6784-1993 Optical Transfer Function - Application - Lenses for Office Copiers 224.0 via email in 1~3 business day valid,,1994-1-1
JB/T 10573-2006 Toolmakers microscope 270.0 via email in 1~3 business day superseded,2014-7-1,2006-10-1
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JB/T 9320-1999 Plane-gratings spectrographs 
  Issued on: 1999-08-06   Price(USD): 380.0
JB/T 11145-2011 X-ray fluorescence spectrometer 
  Issued on: 2011-12-20   Price(USD): 120.0
JB/T 9325-1999 Spectrophotometer series and its basic parameter 
  Issued on: 1999-08-06   Price(USD): 220.0
JB/T 5590-1991 Optical Filter of Optical Spectrum Instrument 
  Issued on: 1991-7-16   Price(USD): 224.0
GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis 
  Issued on: 2002-11-11   Price(USD): 100.0
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA) 
  Issued on: 2002-11-11   Price(USD): 120.0
JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer 
  Issued on: 1991-7-15   Price(USD): 120.0
GB 7667-1996 The dose of X-rays leakage from electron microscope 
  Issued on: 1996-08-13   Price(USD): 184.0
JB/T 5592-1991 V-Prism refractometer 
  Issued on: 1991-7-16   Price(USD): 204.0
GB/T 15247-1994 Electron probe quantitative analysis method of carbon in carbon steel and low alloy steel-Sensitivity curve method (detection limit method) 
  Issued on: 1994-10-17   Price(USD): 264.0
JB/T 5383-1991 Specification for Transmission Electron Microscope 
  Issued on: 1991-7-10   Price(USD): 244.0
JB/T 8235-1999 Monochromator 
  Issued on: 1999-08-06   Price(USD): 260.0
GB/T 26533-2011 General rules for Auger electron spectroscopic analysis 
  Issued on: 2011-5-12   Price(USD): 210.0
GB/T 15247-2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using calibration curve method 
  Issued on: 2008-08-20   Price(USD): 220.0
GB/T 15074-1994 General guide for EPMA quantitative analysis 
  Issued on: 1994-05-09   Price(USD): 150.0
JB/T 7399-1994 Collimator 
  Issued on: 1994-8-23   Price(USD): 120.0
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution 
  Issued on: 1991-7-16   Price(USD): 60.0
JB/T 6841-1993 Terminology of Electronic Optical Instrument 
  Issued on: 1993-7-9   Price(USD): 210.0
JB/T 6784-1993 Optical Transfer Function - Application - Lenses for Office Copiers 
  Issued on: 1993-7-9   Price(USD): 224.0
JB/T 10573-2006 Toolmakers microscope 
  Issued on: 2006-7-27   Price(USD): 270.0
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