Standard No.:	DB52/T 1104-2016
English Name:	Junction-to-case thermal resistance transient test method of semiconductor devices
Chinese Name:	半导体器件结-壳热阻瞬态测试方法
Chinese Classification:	L40    Semiconductor discrete devices in general
Professional Classification:	DB    Provincial Standard
ICS Classification:	31.080.01 31.080.01    Semiconductor devices in general 31.080.01
Source Content Issued by:	Guizhou Bureau of Quality and Technology Supervision
Issued on:	2016-04-01
Implemented on:	2016-10-1
Status:	valid
Target Language:	English
File Format:	PDF

本标准规定了具有单一热流路径的半导体器件结-壳热阻Rth(J-C)的瞬态测试方法。
本标准适用于具有单一热流路径的半导体器件。