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Position: Chinese Standard in English/GB 11114-1989 |
GB 11114-1989 for detecting dislocations of synthetic quartz crystal using X-ray topographic technique (English Version) | |||
Standard No.: | GB 11114-1989 | Status: | abolished |
Language: | English | File Format: | |
Word Count: | 2000 words | Price(USD): | 60.00 remind me the price change |
Implemented on: | 1990-3-1 | Delivery: | via email in 1~3 business day |
Standard No.: | GB 11114-1989 |
English Name: | for detecting dislocations of synthetic quartz crystal using X-ray topographic technique |
Chinese Name: | 人造石英晶体位错X射线形貌检测方法 |
Chinese Classification: | L90 Special electronic technology material |
Professional Classification: | GB National Standard |
Issued by: | AQSIQ |
Issued on: | 1989-3-22 |
Implemented on: | 1990-3-1 |
Status: | abolished |
Abolished on: | 2017-12-15 |
Superseding: | 公告:国家标准公告2017年第31号 |
Language: | English |
File Format: | |
Word Count: | 2000 words |
Price(USD): | 60.00 |
Delivery: | via email in 1~3 business day |
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Keywords: | ||
GB 11114-1989, GB/T 11114-1989, GBT 11114-1989, GB11114-1989, GB 11114, GB11114, GB/T11114-1989, GB/T 11114, GB/T11114, GBT11114-1989, GBT 11114, GBT11114 |