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| Position: Chinese Standard in English/GB 4298-1984 |
| GB 4298-1984 The activation analysis method for the determination of elemental impurities in semiconductor silicon materials (English Version) | |||
| Standard No.: | GB 4298-1984 | Status: | abolished remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 7000 words | Translation Price(USD): | 210.0 remind me the price change |
| Implemented on: | 1985-3-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB 4298-1984 |
| English Name: | The activation analysis method for the determination of elemental impurities in semiconductor silicon materials |
| Chinese Name: | 半导体硅材料中杂质元素的活化分析方法 |
| Chinese Classification: | H17 Semimetal and semiconductor material analysis method |
| Professional Classification: | GB National Standard |
| Source Content Issued by: | NBS |
| Issued on: | 1984-3-28 |
| Implemented on: | 1985-3-1 |
| Status: | abolished |
| Abolished on: | 2017-12-15 |
| Target Language: | English |
| File Format: | |
| Word Count: | 7000 words |
| Translation Price(USD): | 210.0 |
| Delivery: | via email in 1~3 business day |