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Standard
| GB/T 13387-1992 Test method for measuring flat length on slices of electronic materials (English Version) |
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Detail of GB/T 13387-1992
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Introduction of GB/T 13387-1992
本标准规定了电子材料晶片参考面长度的测量方法。本标准适用于测量各种直径的硅抛光片、研磨片和切割片的参考面长度。也适用于测量砷化镓、蓝宝石和钆镓石榴石等材料晶片的参考面长度。
Contents of GB/T 13387-1992