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Position: Chinese Standard in English/GB/T 14143-1993 |
GB/T 14143-1993 300~900μm Silicon slices-Measuring of interstitial oxygen content-Infrared absorption method (English Version) | |||
Standard No.: | GB/T 14143-1993 | Status: | superseded remind me the status change
Email: |
Language: | English | File Format: | |
Word Count: | 2500 words | Price(USD): | 220.0 remind me the price change
Email: |
Implemented on: | 1993-10-1 | Delivery: | via email in 1~3 business day |
Standard No.: | GB/T 14143-1993 |
English Name: | 300~900μm Silicon slices-Measuring of interstitial oxygen content-Infrared absorption method |
Chinese Name: | 300?900 UM 硅片间隙氧含量红外吸收测量方法 |
Chinese Classification: | H26 Metal nondestructive testing method |
Professional Classification: | GB National Standard |
Issued by: | China State Bureau of Technical Supervision |
Issued on: | 1993-02-06 |
Implemented on: | 1993-10-1 |
Status: | superseded |
Superseded by: | GB/T 1557-2006 The method of determining interstitial oxygen content in silicon by infrared absorption |
Superseded on: | 2006-11-1 |
Abolished on: | 2006-11-01 |
Language: | English |
File Format: | |
Word Count: | 2500 words |
Price(USD): | 220.0 |
Delivery: | via email in 1~3 business day |
GB/T 14143-1993 300~900μm Silicon slices-Measuring of interstitial oxygen content-Infrared absorption method (English Version) | |||
Standard No. | GB/T 14143-1993 | ||
Status | superseded | ||
Language | English | ||
File Format | |||
Word Count | 2500 words | ||
Price(USD) | 220.0 | ||
Implemented on | 1993-10-1 | ||
Delivery | via email in 1~3 business day |
Standard No. |
GB/T 14143-1993 |
English Name |
300~900μm Silicon slices-Measuring of interstitial oxygen content-Infrared absorption method |
Chinese Name |
300?900 UM 硅片间隙氧含量红外吸收测量方法 |
Chinese Classification |
H26 |
Professional Classification |
GB |
ICS Classification |
Issued by |
China State Bureau of Technical Supervision |
Issued on |
1993-02-06 |
Implemented on |
1993-10-1 |
Status |
superseded |
Superseded by |
GB/T 1557-2006 The method of determining interstitial oxygen content in silicon by infrared absorption |
Superseded on |
2006-11-1 |
Abolished on |
2006-11-01 |
Superseding |
Language |
English |
File Format |
Word Count |
2500 words |
Price(USD) |
220.0 |
Keywords |
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Keywords: | ||
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