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| Position: Chinese Standard in English/GB/T 14849.4-2014 |
| GB/T 14849.4-2014 Methods for chemical analysis of silicon metal - Part 4:Determination of impurity contents - Inductively coupled plasma atomic emission spectrometric method (English Version) | |||
| Standard No.: | GB/T 14849.4-2014 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 6000 words | Price(USD): | 120.00 remind me the price change |
| Implemented on: | 2015-8-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 14849.4-2014 |
| English Name: | Methods for chemical analysis of silicon metal - Part 4:Determination of impurity contents - Inductively coupled plasma atomic emission spectrometric method |
| Chinese Name: | 工业硅化学分析方法 第4部分：杂质元素含量的测定 电感耦合等离子体原子发射光谱法 |
| Chinese Classification: | H12 Light metals and their alloys analysis method |
| Professional Classification: | GB National Standard |
| ICS Classification: | 77.120.10 Aluminium and aluminium alloys |
| Issued by: | AQSIQ; SAC |
| Issued on: | 2014-12-05 |
| Implemented on: | 2015-8-1 |
| Status: | valid |
| Superseding: | GB/T 14849.4-2008 for chemical analysis of silicon metal - Part 4: Determination of elements content Inductively coupled plasma atomic emission spectrometric method |
| Language: | English |
| File Format: | |
| Word Count: | 6000 words |
| Price(USD): | 120.00 |
| Delivery: | via email in 1~3 business day |