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Position: Chinese Standard in English/GB/T 1554-1995 |
GB/T 1554-1995 Test method for crystallographic perfection of silicon by preferential etch techniques (English Version) | |||
Standard No.: | GB/T 1554-1995 | Status: | superseded remind me the status change
Email: |
Language: | English | File Format: | |
Word Count: | 5500 words | Price(USD): | 410.0 remind me the price change
Email: |
Implemented on: | 1995-12-1 | Delivery: | via email in 1~3 business day |
Standard No.: | GB/T 1554-1995 |
English Name: | Test method for crystallographic perfection of silicon by preferential etch techniques |
Chinese Name: | 硅晶体完整性化学择优腐蚀检验方法 |
Chinese Classification: | H26 Metal nondestructive testing method |
Professional Classification: | GB National Standard |
ICS Classification: | 77.040.30 77.040.30 Chemical analysis of metals 77.040.30 |
Issued by: | SBTS |
Issued on: | 1995-04-18 |
Implemented on: | 1995-12-1 |
Status: | superseded |
Superseded by: | GB/T 1554-2009 Testing method for crystallographic perfection of silicon by preferential etch techniques |
Superseded on: | 2010-6-1 |
Superseding: | GB 1554-1979 GB 4057-1983 Singie crystal sllicon-Detection of microdefects-Chemical etching technique |
Language: | English |
File Format: | |
Word Count: | 5500 words |
Price(USD): | 410.0 |
Delivery: | via email in 1~3 business day |
GB/T 1554-1995 Test method for crystallographic perfection of silicon by preferential etch techniques (English Version) | |||
Standard No. | GB/T 1554-1995 | ||
Status | superseded | ||
Language | English | ||
File Format | |||
Word Count | 5500 words | ||
Price(USD) | 410.0 | ||
Implemented on | 1995-12-1 | ||
Delivery | via email in 1~3 business day |
Standard No. |
GB/T 1554-1995 |
English Name |
Test method for crystallographic perfection of silicon by preferential etch techniques |
Chinese Name |
硅晶体完整性化学择优腐蚀检验方法 |
Chinese Classification |
H26 |
Professional Classification |
GB |
ICS Classification |
Issued by |
SBTS |
Issued on |
1995-04-18 |
Implemented on |
1995-12-1 |
Status |
superseded |
Superseded by |
GB/T 1554-2009 Testing method for crystallographic perfection of silicon by preferential etch techniques |
Superseded on |
2010-6-1 |
Abolished on |
Superseding |
GB 1554-1979 GB 4057-1983 Singie crystal sllicon-Detection of microdefects-Chemical etching technique |
Language |
English |
File Format |
Word Count |
5500 words |
Price(USD) |
410.0 |
Keywords |
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Keywords: | ||
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