GB/T 19403.1-2003 English Version, GB/T 19403.1-2003 Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits) (English Version)

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GB/T 19403.1-2003 Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits) (English Version)
Standard No.:	GB/T 19403.1-2003	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	10000 words	Translation Price(USD):	300.0 remind me the price change Email:
Implemented on:	2004-8-1	Delivery:	via email in 1~3 business day

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Standard No.:	GB/T 19403.1-2003
English Name:	Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits)
Chinese Name:	半导体器件集成电路第11部分：第1篇：半导体集成电路内部目检（不包括混合电路）
Chinese Classification:	L56 Semiconductor integrated circuit
Professional Classification:	GB National Standard
Source Content Issued by:	AQSIQ
Issued on:	2003-11-24
Implemented on:	2004-8-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	10000 words
Translation Price(USD):	300.0
Delivery:	via email in 1~3 business day

Standard

GB/T 19403.1-2003 Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits) (English Version)
Standard No.	GB/T 19403.1-2003
Status	valid
Language	English
File Format	PDF
Word Count	10000 words
Price(USD)	300.0
Implemented on	2004-8-1
Delivery	via email in 1~3 business day

Detail of GB/T 19403.1-2003

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Introduction of GB/T 19403.1-2003

本部分为GB/T19403的一部分，等同采用国际电工委员会标准IEC60748-11-1：1992《半导体器件集成电路第11部分：第1节：半导体集成电路内部目检》。

Contents of GB/T 19403.1-2003

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