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Position: Chinese Standard in English/GB/T 19444-2004
GB/T 19444-2004   Oxygen precipitation characterization of silicon wafers by measurement of interstitial oxygen reduction (English Version)
Standard No.: GB/T 19444-2004 Status:valid remind me the status change
Language:English File Format:PDF
Word Count: 3000 words Price(USD):85.00 remind me the price change
Implemented on:2004-7-1 Delivery: via email in 1~3 business day
Standard No.: GB/T 19444-2004
English Name: Oxygen precipitation characterization of silicon wafers by measurement of interstitial oxygen reduction
Chinese Name: 硅片氧沉淀特性的测定-间隙氧含量减少法
Chinese Classification: H26    Metal nondestructive testing method
Professional Classification: GB    National Standard
ICS Classification: 29.040.01 29.040.01    Insulating fluids in general 29.040.01
Issued by: AQSIQ;SAC
Issued on: 2004-2-5
Implemented on: 2004-7-1
Status: valid
Language: English
File Format: PDF
Word Count: 3000 words
Price(USD): 85.00
Delivery: via email in 1~3 business day
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