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Position: Chinese Standard in English/GB/T 20724-2006
GB/T 20724-2006   Method of thickness measurement for thin crystal by convergent beam electron diffraction (English Version)
Standard No.: GB/T 20724-2006 Status:superseded
Language:English File Format:PDF
Word Count: 2000 words Price(USD):60.00 remind me the price change
Implemented on:2007-8-1 Delivery: via email in 1~3 business day
Standard No.: GB/T 20724-2006
English Name: Method of thickness measurement for thin crystal by convergent beam electron diffraction
Chinese Name: 薄晶体厚度的会聚束电子衍射测定方法
Chinese Classification: N53    Electrochemical, thermochemistry and optical profile type analyzer
Professional Classification: GB    National Standard
ICS Classification: 71.040.99 71.040.99    Other standards related to analytical chemistry 71.040.99
Issued by: AQSIQ; SAC
Issued on: 2007-03-26
Implemented on: 2007-8-1
Status: superseded
Superseded by:GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
Superseded on:2022-7-1
Language: English
File Format: PDF
Word Count: 2000 words
Price(USD): 60.00
Delivery: via email in 1~3 business day
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