Standard No.:	GB/T 23413-2009
English Name:	Determination of crystallite size and micro - strain of nano - Materials - X - ray diffraction line broadening method
Chinese Name:	纳米材料晶粒尺寸及微观应变的测定 X射线衍射线宽化法
Chinese Classification:	N78    X ray, magnetic powder, fluorescent light and other defectoscope
Professional Classification:	GB    National Standard
Issued by:	SAC AQSIQ
Issued on:	2009-4-1
Implemented on:	2009-12-1
Status:	valid
Language:	English
File Format:	PDF
Word Count:	5000 words
Price(USD):	150.00
Delivery:	via email in 1~3 business day

本标准规定了利用X射线衍射线宽化法来测定纳米材料晶粒尺寸和微观应变的方法。本标准采用的计算方法是近似函数法。
本标准适用于测定晶粒尺寸一般不大于100nm，微观应变一般不大于0.1%的纳米材料。