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| GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary (English Version) |
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Detail of GB/T 23414-2009
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Introduction of GB/T 23414-2009
本标准定义了扫描电子显微术(SEM)实践中使用的术语。包括一般术语和按技术分类的具体概念的术语,也包括已经在ISO23833中定义的术语。
本标准适用于所有有关SEM 实践的标准化文件。另外,本标准的某些术语定义,也适用于相关领域的文件〔例如:电子探针显微分析(EPMA)、分析电子显微术(AEM)、能谱法(EDX)等〕。
Contents of GB/T 23414-2009