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| Position: Chinese Standard in English/GB/T 24582-2023 |
| GB/T 24582-2023 Test method for measuring surface metal impurity content of polycrystalline silicon—Acid extraction-inductively coupled plasma mass spectrometry method (English Version) | |||
| Standard No.: | GB/T 24582-2023 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 6500 words | Price(USD): | 170.0 remind me the price change |
| Implemented on: | 2024-3-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 24582-2023 |
| English Name: | Test method for measuring surface metal impurity content of polycrystalline silicon—Acid extraction-inductively coupled plasma mass spectrometry method |
| Chinese Name: | 多晶硅表面金属杂质含量测定 酸浸取-电感耦合等离子体质谱法 |
| Chinese Classification: | H17 Semimetal and semiconductor material analysis method |
| Professional Classification: | GB National Standard |
| Issued by: | SAMR; SAC |
| Issued on: | 2023-08-06 |
| Implemented on: | 2024-3-1 |
| Status: | valid |
| Superseding: | GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry |
| Language: | English |
| File Format: | |
| Word Count: | 6500 words |
| Price(USD): | 170.0 |
| Delivery: | via email in 1~3 business day |