 |
Chinese Classification
Professional Classification
ICS Classification
Latest
News
Value-added Services
|
LoginRegister |
| Position: Chinese Standard in English/GB/T 30860-2014 |
| GB/T 30860-2014 Test methods for surface roughness and saw mark of silicon wafers for solar cells (English Version) | |||
| Standard No.: | GB/T 30860-2014 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 6000 words | Price(USD): | 180.00 remind me the price change |
| Implemented on: | 2015-4-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 30860-2014 |
| English Name: | Test methods for surface roughness and saw mark of silicon wafers for solar cells |
| Chinese Name: | 太阳能电池用硅片表面粗糙度及切割线痕测试方法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| Issued by: | AQSIQ; SAC |
| Issued on: | 2014-07-24 |
| Implemented on: | 2015-4-1 |
| Status: | valid |
| Language: | English |
| File Format: | |
| Word Count: | 6000 words |
| Price(USD): | 180.00 |
| Delivery: | via email in 1~3 business day |