GB/T 30869-2014 English Version, GB/T 30869-2014 Test method for thickness and total thickness variation of silicon wafers for solar cell (English Version)

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GB/T 30869-2014 Test method for thickness and total thickness variation of silicon wafers for solar cell (English Version)
Standard No.:	GB/T 30869-2014	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	5500 words	Translation Price(USD):	150.0 remind me the price change Email:
Implemented on:	2015-2-1	Delivery:	via email in 1~3 business day

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Standard No.:	GB/T 30869-2014
English Name:	Test method for thickness and total thickness variation of silicon wafers for solar cell
Chinese Name:	太阳能电池用硅片厚度及总厚度变化测试方法
Chinese Classification:	H21 Metal physical property test method
Professional Classification:	GB National Standard
Source Content Issued by:	AQSIQ; SAC
Issued on:	2014-07-24
Implemented on:	2015-2-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	5500 words
Translation Price(USD):	150.0
Delivery:	via email in 1~3 business day

Standard

GB/T 30869-2014 Test method for thickness and total thickness variation of silicon wafers for solar cell (English Version)
Standard No.	GB/T 30869-2014
Status	valid
Language	English
File Format	PDF
Word Count	5500 words
Price(USD)	150.0
Implemented on	2015-2-1
Delivery	via email in 1~3 business day

Detail of GB/T 30869-2014

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Introduction of GB/T 30869-2014

本标准规定了太阳能电池用硅片(以下简称硅片)厚度及总厚度变化的分立式和扫描式测量方法。
本标准适用于符合 GB/T26071、GB/T29055规定尺寸的硅片的厚度及总厚度变化的测量,分立式测量方法适用于接触式及非接触式测量,扫描式测量方法只适用于非接触式测量。在测量仪器准许的情况下,本标准也可用于其他规格硅片的厚度及总厚度变化的测量。

Contents of GB/T 30869-2014

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