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| Position: Chinese Standard in English/GB/T 31854-2015 |
| GB/T 31854-2015 Test method for measuring metallic impurities content in silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry (English Version) | |||
| Standard No.: | GB/T 31854-2015 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 5500 words | Price(USD): | 140.00 remind me the price change |
| Implemented on: | 2016-3-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 31854-2015 |
| English Name: | Test method for measuring metallic impurities content in silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry |
| Chinese Name: | 光伏电池用硅材料中金属杂质含量的电感耦合等离子体质谱测量方法 |
| Chinese Classification: | H82 Elemental semiconductor material |
| Professional Classification: | GB National Standard |
| ICS Classification: | 29.045 Semiconducting materials |
| Issued by: | AQSIQ; SAC |
| Issued on: | 2015-07-03 |
| Implemented on: | 2016-3-1 |
| Status: | valid |
| Language: | English |
| File Format: | |
| Word Count: | 5500 words |
| Price(USD): | 140.00 |
| Delivery: | via email in 1~3 business day |