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Standard
| GB/T 32188-2015 The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate (English Version) |
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Detail of GB/T 32188-2015
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Introduction of GB/T 32188-2015
本标准规定了利用双晶 X射线衍射仪测试氮化镓单晶衬底片摇摆曲线半高宽的方法。
本标准适用于化学气相沉积及其他方法生长制备的氮化镓单晶衬底片。
Contents of GB/T 32188-2015