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| Position: Chinese Standard in English/GB/T 32280-2022 |
| GB/T 32280-2022 Test method for warp and bow of silicon wafers—Automated non-contact scanning method (English Version) | |||
| Standard No.: | GB/T 32280-2022 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 8500 words | Price(USD): | 255.00 remind me the price change |
| Implemented on: | 2022-10-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 32280-2022 |
| English Name: | Test method for warp and bow of silicon wafers—Automated non-contact scanning method |
| Chinese Name: | 硅片翘曲度和弯曲度的测试 自动非接触扫描法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| Issued by: | SAMR; SAC |
| Issued on: | 2022-03-09 |
| Implemented on: | 2022-10-1 |
| Status: | valid |
| Superseding: | GB/T 32280-2015 Test method for warp of silicon wafers—Automated non-contact scanning method |
| Language: | English |
| File Format: | |
| Word Count: | 8500 words |
| Price(USD): | 255.00 |
| Delivery: | via email in 1~3 business day |