GB/T 32817-2016 English Version, GB/T 32817-2016 Semiconductor devices - Micro-electromechanical devices - Generic specification for MEMS (English Version)

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GB/T 32817-2016 Semiconductor devices - Micro-electromechanical devices - Generic specification for MEMS (English Version)
Standard No.:	GB/T 32817-2016	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	10500 words	Translation Price(USD):	310.0 remind me the price change Email:
Implemented on:	2017-3-1	Delivery:	via email in 1~5 business day

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Standard No.:	GB/T 32817-2016
English Name:	Semiconductor devices - Micro-electromechanical devices - Generic specification for MEMS
Chinese Name:	半导体器件微机电器件 MEMS总规范
Chinese Classification:	L55 Microcircuit in general
Professional Classification:	GB National Standard
ICS Classification:	31.080.99 31.080.99 Other semiconductor devices 31.080.99
Source Content Issued by:	AQSIQ; SAC
Issued on:	2016-08-29
Implemented on:	2017-3-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	10500 words
Translation Price(USD):	310.0
Delivery:	via email in 1~5 business day

Standard

GB/T 32817-2016 Semiconductor devices - Micro-electromechanical devices - Generic specification for MEMS (English Version)
Standard No.	GB/T 32817-2016
Status	valid
Language	English
File Format	PDF
Word Count	10500 words
Price(USD)	310.0
Implemented on	2017-3-1
Delivery	via email in 1~5 business day

Detail of GB/T 32817-2016

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Introduction of GB/T 32817-2016

本标准描述了用半导体制造的微机电系统（MEMS）的总规范，规定了用于IECQ-CECC体系质量评定的一般规程，给出了电、光、机械和环境特性的描述和测试的总则。本标准适用于各类MEMS器件[如传感器、射频MEMS，但不包括光MEMS、生物MEMS、微全分析系统（Micro-TAS）和微能源MEMS]。

Contents of GB/T 32817-2016

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