GB/T 33922-2017 English Version, GB/T 33922-2017 Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances (English Version)

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GB/T 33922-2017 Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances (English Version)
Standard No.:	GB/T 33922-2017	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	7500 words	Translation Price(USD):	180.0 remind me the price change Email:
Implemented on:	2018-2-1	Delivery:	via email in 1~3 business day

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Standard No.:	GB/T 33922-2017
English Name:	Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances
Chinese Name:	MEMS压阻式压力敏感芯片性能的圆片级试验方法
Chinese Classification:	L55 Microcircuit in general
Professional Classification:	GB National Standard
Source Content Issued by:	MOHURD; AQSIQ
Issued on:	2017-07-12
Implemented on:	2018-2-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	7500 words
Translation Price(USD):	180.0
Delivery:	via email in 1~3 business day

Standard

GB/T 33922-2017 Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances (English Version)
Standard No.	GB/T 33922-2017
Status	valid
Language	English
File Format	PDF
Word Count	7500 words
Price(USD)	180.0
Implemented on	2018-2-1
Delivery	via email in 1~3 business day

Detail of GB/T 33922-2017

Standard No.

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Chinese Classification

Professional Classification

ICS Classification

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Introduction of GB/T 33922-2017

本标准规定了MEMS压阻式压力敏感芯片（简称压力敏感芯片）的术语和定义、试验条件、试验的一般规定、试验内容和方法。本标准适用于闭环和开环MEMS压阻式压力敏感芯片性能的圆片级试验。

Contents of GB/T 33922-2017

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