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Position: Chinese Standard in English/GB/T 33922-2017
GB/T 33922-2017   Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances (English Version)
Standard No.: GB/T 33922-2017 Status:valid remind me the status change
Language:English File Format:PDF
Word Count: 7500 words Price(USD):180.00 remind me the price change
Implemented on:2018-2-1 Delivery: via email in 1~3 business day
Standard No.: GB/T 33922-2017
English Name: Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances
Chinese Name: MEMS压阻式压力敏感芯片性能的圆片级试验方法
Chinese Classification: L55    Microcircuit in general
Professional Classification: GB    National Standard
Issued by: MOHURD; AQSIQ
Issued on: 2017-07-12
Implemented on: 2018-2-1
Status: valid
Language: English
File Format: PDF
Word Count: 7500 words
Price(USD): 180.00
Delivery: via email in 1~3 business day
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