GB/T 42691.7-2023 Road vehicles - Local Interconnect Network (LIN) - Part 7: Electrical Physical Layer (EPL) conformance test specification
1 Scope
This document specifies the conformance test for the electrical physical layer (EPL) of the LIN communications system. It is part of this document to define a test that considers ISO 9646 and ISO 17987-4.
The purpose of this document is to provide a standardized way to verify whether a LIN bus driver is compliant to ISO 17987-4. The primary motivation is to ensure a level of interoperability of LIN bus drivers from different sources in a system environment.
This document provides all the necessary technical information to ensure that test results are consistent even on different test systems, provided that the particular test suite and the test system are compliant to the content of this document.
2 Normative references
The following documents are referred to in text in such a way that some or all of their content constitutes requirements of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
GB/T 42691.4-2023 Road vehicles - Local Interconnect Network (LIN) - Part 4: Electrical physical layer (EPL) specification 12 V/24 V (ISO 17987-4:2016, IDT)
ISO 17987-6 Road vehicles - Local Interconnect Network (LIN) - Part 6: Protocol conformance test specification
Note: GB/T 42691.6-2023, Road vehicles - Local Interconnect Network (LIN) - Part 6: Protocol conformance test specification (ISO 17987-6:2016, IDT)
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the terms and definitions in ISO 17987-4 and ISO 17987-6 apply.
3.2 Symbols
%: Percentage
µs: Microsecond
C1/2: capacitance
CCOMMON: capacitance in the communication line
C’LINE: line capacitance
CBUS: total bus capacitance
CMASTER: capacitance of master node
CREF: reference capacitance
CRXD: RXD capacitance (LIN receiver, RXD capacitive load condition)
CSLAVE: capacitance of slave node
∈: mathematical symbol: replacement for “is an element of”
d2V/dt2: second derivative of Voltage (Volt 2 per second 2 )
di/dt: instantaneous rate of current change (amps per second)
D1/2: diode
Dser_int: serial internal diode at transceiver IC
Dser_master: serial master diode
FTS: test system bit rate
IBUS: current into the ECU bus line
IBUS_LIM: current limitation for driver dominant state driver on VBUS = VBAT_max into ECU bus line
IBUS_NO_BAT: current at ECU bus line when VBAT is disconnected
IBUS_NO_GND: current at ECU bus line when VGND_ECU is disconnected
IBUS_PAS_dom: current at ECU bus line when driver off (passive) at dominant LIN-bus-level (12 V LIN devices: VBUS = 0 V and VBAT = 12 V; 24 V LIN devices: VBUS = 0 V and VBAT = 24 V)
IBUS_PAS_rec: current at ECU bus line when driver off (passive) at recessive LIN-bus-level (12 V LIN devices: 8 V < VBAT < 18 V; 8 V < VBUS < 18 V; VBUS ≥ VBAT ; 24 V LIN devices: 16 V < VBAT < 36 V; 16 V < VBUS < 36 V; VBUS ≥ VBAT)
GNDDevice: GND of ECU
kΩ: kilo ohm
kbit/s: kilo bit per second
LENBUS: total length of bus line
LINBus: LIN network
ms: millisecond
nF: nano farad
pF: pico farad
pF/m: pico farad per meter (line capacitance)
R1/2: resistor
RCOMMON: resistor in the communication line
RBUS: total bus-resistor including all slave and master resistors RBUS = RMaster || RSLAVE_1 || RSLAVE_2 || to || RSLAVE_N
RREF: reference resistor
Rmaster: master resistor
Rpull_up: pull-up resistor
Rslave: slave resistor
tBFS: byte field synchronization time
tBIT: basic bit times
tEBS: earliest bit sample time
trx_pd: propagation delay of receiver
trx_sym: symmetry of receiver propagation delay rising edge propagation delay of receiver
tLBS: latest bit sample time
trx_pdf(1): propagation delay time of receiving node 1 at falling (recessive to dominant) LIN bus edge
trx_pdf(2): propagation delay time of receiving node 2 at falling (recessive to dominant) LIN bus edge
trx_pdr(1): propagation delay time of receiving node 1 at rising (dominant to recessive) LIN bus edge
trx_pdr(2): propagation delay time of receiving node 2 at rising (dominant to recessive) LIN bus edge
tSR: sample window repetition time
THDom(max): maximum dominant threshold of receiving node (volt)
THDom(min): minimum dominant threshold of receiving node (volt)
THRec(max): maximum recessive threshold of receiving node (volt)
THRec(min): minimum recessive threshold of receiving node (volt)
V: voltage
VANODE: voltage at the anode of the diode
VBAT: voltage across the ECU supply connectors
VBATTERY: voltage across the vehicle battery connectors
VBS1/2: battery shift
VBUS: voltage on the LIN bus
VBUS_CNT: centre point of receiver threshold
VBUS_dom: receiver dominant voltage
VBUS_rec: receiver recessive voltage
VCATHODE: voltage at the cathode of the diode
VCC1/2: positive power supply voltage (e.g. 5 V)
VD1/2: voltage at diode between anode and cathode
VDom: dominant voltage
VGND1/2: ground shift
VGND_BATTERY: battery ground voltage
VGND_ECU: voltage on the local ECU ground connector with respect to vehicle battery ground con-nector (VGND_BATTERY)
VIUT: voltage at IUT supply pins
VPS1/2: voltage at remote power supply no. 1/no. 2
VRec: recessive voltage
VSerDiode: voltage drop at the serial diodes
VShift_BAT: battery shift
VShift_Difference: difference between battery shift and GND shift
VShift_GND: GND shift
VSUP: voltage at transceiver supply pins
VSUP_NON_OP: voltage which the device is not destroyed; no guarantee of correct operation
Vth_dom: receiver threshold voltage of the recessive to dominant LIN bus edge
Vth_rec: receiver threshold voltage of the dominant to recessive LIN bus edge
ΔF/FNom: deviation from nominal bit rate
τ: time constant
Ω: ohm
3.3 Abbreviated terms
The following Abbreviated terms apply to this document.
AC: alternate current
API: application programmers interface
ASIC: application specific integrated circuit
BFS: byte field synchronization
GB/T 42691.7-2023 Road vehicles - Local Interconnect Network (LIN) - Part 7: Electrical Physical Layer (EPL) conformance test specification
1 Scope
This document specifies the conformance test for the electrical physical layer (EPL) of the LIN communications system. It is part of this document to define a test that considers ISO 9646 and ISO 17987-4.
The purpose of this document is to provide a standardized way to verify whether a LIN bus driver is compliant to ISO 17987-4. The primary motivation is to ensure a level of interoperability of LIN bus drivers from different sources in a system environment.
This document provides all the necessary technical information to ensure that test results are consistent even on different test systems, provided that the particular test suite and the test system are compliant to the content of this document.
2 Normative references
The following documents are referred to in text in such a way that some or all of their content constitutes requirements of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
GB/T 42691.4-2023 Road vehicles - Local Interconnect Network (LIN) - Part 4: Electrical physical layer (EPL) specification 12 V/24 V (ISO 17987-4:2016, IDT)
ISO 17987-6 Road vehicles - Local Interconnect Network (LIN) - Part 6: Protocol conformance test specification
Note: GB/T 42691.6-2023, Road vehicles - Local Interconnect Network (LIN) - Part 6: Protocol conformance test specification (ISO 17987-6:2016, IDT)
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the terms and definitions in ISO 17987-4 and ISO 17987-6 apply.
3.2 Symbols
%: Percentage
µs: Microsecond
C1/2: capacitance
CCOMMON: capacitance in the communication line
C’LINE: line capacitance
CBUS: total bus capacitance
CMASTER: capacitance of master node
CREF: reference capacitance
CRXD: RXD capacitance (LIN receiver, RXD capacitive load condition)
CSLAVE: capacitance of slave node
∈: mathematical symbol: replacement for “is an element of”
d2V/dt2: second derivative of Voltage (Volt 2 per second 2 )
di/dt: instantaneous rate of current change (amps per second)
D1/2: diode
Dser_int: serial internal diode at transceiver IC
Dser_master: serial master diode
FTS: test system bit rate
IBUS: current into the ECU bus line
IBUS_LIM: current limitation for driver dominant state driver on VBUS = VBAT_max into ECU bus line
IBUS_NO_BAT: current at ECU bus line when VBAT is disconnected
IBUS_NO_GND: current at ECU bus line when VGND_ECU is disconnected
IBUS_PAS_dom: current at ECU bus line when driver off (passive) at dominant LIN-bus-level (12 V LIN devices: VBUS = 0 V and VBAT = 12 V; 24 V LIN devices: VBUS = 0 V and VBAT = 24 V)
IBUS_PAS_rec: current at ECU bus line when driver off (passive) at recessive LIN-bus-level (12 V LIN devices: 8 V < VBAT < 18 V; 8 V < VBUS < 18 V; VBUS ≥ VBAT ; 24 V LIN devices: 16 V < VBAT < 36 V; 16 V < VBUS < 36 V; VBUS ≥ VBAT)
GNDDevice: GND of ECU
kΩ: kilo ohm
kbit/s: kilo bit per second
LENBUS: total length of bus line
LINBus: LIN network
ms: millisecond
nF: nano farad
pF: pico farad
pF/m: pico farad per meter (line capacitance)
R1/2: resistor
RCOMMON: resistor in the communication line
RBUS: total bus-resistor including all slave and master resistors RBUS = RMaster || RSLAVE_1 || RSLAVE_2 || to || RSLAVE_N
RREF: reference resistor
Rmaster: master resistor
Rpull_up: pull-up resistor
Rslave: slave resistor
tBFS: byte field synchronization time
tBIT: basic bit times
tEBS: earliest bit sample time
trx_pd: propagation delay of receiver
trx_sym: symmetry of receiver propagation delay rising edge propagation delay of receiver
tLBS: latest bit sample time
trx_pdf(1): propagation delay time of receiving node 1 at falling (recessive to dominant) LIN bus edge
trx_pdf(2): propagation delay time of receiving node 2 at falling (recessive to dominant) LIN bus edge
trx_pdr(1): propagation delay time of receiving node 1 at rising (dominant to recessive) LIN bus edge
trx_pdr(2): propagation delay time of receiving node 2 at rising (dominant to recessive) LIN bus edge
tSR: sample window repetition time
THDom(max): maximum dominant threshold of receiving node (volt)
THDom(min): minimum dominant threshold of receiving node (volt)
THRec(max): maximum recessive threshold of receiving node (volt)
THRec(min): minimum recessive threshold of receiving node (volt)
V: voltage
VANODE: voltage at the anode of the diode
VBAT: voltage across the ECU supply connectors
VBATTERY: voltage across the vehicle battery connectors
VBS1/2: battery shift
VBUS: voltage on the LIN bus
VBUS_CNT: centre point of receiver threshold
VBUS_dom: receiver dominant voltage
VBUS_rec: receiver recessive voltage
VCATHODE: voltage at the cathode of the diode
VCC1/2: positive power supply voltage (e.g. 5 V)
VD1/2: voltage at diode between anode and cathode
VDom: dominant voltage
VGND1/2: ground shift
VGND_BATTERY: battery ground voltage
VGND_ECU: voltage on the local ECU ground connector with respect to vehicle battery ground con-nector (VGND_BATTERY)
VIUT: voltage at IUT supply pins
VPS1/2: voltage at remote power supply no. 1/no. 2
VRec: recessive voltage
VSerDiode: voltage drop at the serial diodes
VShift_BAT: battery shift
VShift_Difference: difference between battery shift and GND shift
VShift_GND: GND shift
VSUP: voltage at transceiver supply pins
VSUP_NON_OP: voltage which the device is not destroyed; no guarantee of correct operation
Vth_dom: receiver threshold voltage of the recessive to dominant LIN bus edge
Vth_rec: receiver threshold voltage of the dominant to recessive LIN bus edge
ΔF/FNom: deviation from nominal bit rate
τ: time constant
Ω: ohm
3.3 Abbreviated terms
The following Abbreviated terms apply to this document.
AC: alternate current
API: application programmers interface
ASIC: application specific integrated circuit
BFS: byte field synchronization
