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| Position: Chinese Standard in English/GB/T 42706.2-2023 |
| GB/T 42706.2-2023 Electronic components—Long-term storage of electronic semiconductor devices—Part 2：Deterioration mechanisms (English Version) | |||
| Standard No.: | GB/T 42706.2-2023 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 9500 words | Translation Price(USD): | 285.0 remind me the price change |
| Implemented on: | 2023-9-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 42706.2-2023 |
| English Name: | Electronic components—Long-term storage of electronic semiconductor devices—Part 2：Deterioration mechanisms |
| Chinese Name: | 电子元器件 半导体器件长期贮存 第2部分：退化机理 |
| Chinese Classification: | L40 Semiconductor discrete devices in general |
| Professional Classification: | GB National Standard |
| Source Content Issued by: | SAMR; SAC |
| Issued on: | 2023-05-23 |
| Implemented on: | 2023-9-1 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 9500 words |
| Translation Price(USD): | 285.0 |
| Delivery: | via email in 1~3 business day |