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Position: Chinese Standard in English/GB/T 43748-2024 |
GB/T 43748-2024 Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips (English Version) | |||
Standard No.: | GB/T 43748-2024 | Status: | valid remind me the status change |
Language: | English | File Format: | |
Word Count: | 7500 words | Price(USD): | 225.00 remind me the price change |
Implemented on: | 2024-10-1 | Delivery: | via email in 1~3 business day |
Standard No.: | GB/T 43748-2024 |
English Name: | Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips |
Chinese Name: | 微束分析 透射电子显微术 集成电路芯片中功能薄膜层厚度的测定方法 |
Chinese Classification: | N33 Electron optics and other physical optics instrument |
Professional Classification: | GB National Standard |
ICS Classification: | 71.040.50 Physicochemical methods of analysis |
Issued by: | SAMR; SAC |
Issued on: | 2024-3-15 |
Implemented on: | 2024-10-1 |
Status: | valid |
Language: | English |
File Format: | |
Word Count: | 7500 words |
Price(USD): | 225.00 |
Delivery: | via email in 1~3 business day |
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Keywords: | ||
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