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Position: Chinese Standard in English/GB/T 43748-2024
GB/T 43748-2024   Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips (English Version)
Standard No.: GB/T 43748-2024 Status:valid remind me the status change
Language:English File Format:PDF
Word Count: 7500 words Price(USD):225.00 remind me the price change
Implemented on:2024-10-1 Delivery: via email in 1~3 business day
Standard No.: GB/T 43748-2024
English Name: Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips
Chinese Name: 微束分析 透射电子显微术 集成电路芯片中功能薄膜层厚度的测定方法
Chinese Classification: N33    Electron optics and other physical optics instrument
Professional Classification: GB    National Standard
ICS Classification: 71.040.50 71.040.50    Physicochemical methods of analysis 71.040.50
Issued by: SAMR; SAC
Issued on: 2024-3-15
Implemented on: 2024-10-1
Status: valid
Language: English
File Format: PDF
Word Count: 7500 words
Price(USD): 225.00
Delivery: via email in 1~3 business day
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