GB/T 44937.1-2025 English, GB/T 44937.1-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 1:General conditions and definitions (English)

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GB/T 44937.1-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 1:General conditions and definitions (English)
Standard No.:	GB/T 44937.1-2025	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	18200 words	Translation Price(USD):	728.0 remind me the price change Email:
Implemented on:	2026-7-1	Delivery:	via email in 1~5 business day

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Standard No.:	GB/T 44937.1-2025
English Name:	Integrated circuits—Measurement of electromagnetic emissions—Part 1:General conditions and definitions
Chinese Name:	集成电路电磁发射测量第1部分: 通用条件和定义
Chinese Classification:	L56 Semiconductor integrated circuit
Professional Classification:	GB National Standard
ICS Classification:	31.2 31.2 Integrated circuits. Microelectronics 31.2
Source Content Issued by:	SAMR;SAC
Issued on:	2025-12-31
Implemented on:	2026-7-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	18200 words
Translation Price(USD):	728.0
Delivery:	via email in 1~5 business day

Standard

GB/T 44937.1-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 1:General conditions and definitions (English)
Standard No.	GB/T 44937.1-2025
Status	valid
Language	English
File Format	PDF
Word Count	18200 words
Translation Price(USD)	728.0
Implemented on	2026-7-1
Delivery	via email in 1~5 business day

Detail of GB/T 44937.1-2025

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Introduction of GB/T 44937.1-2025

本文件提供了集成电路的传导和辐射电磁发射测量的通用信息和定义，同时也给出了试验条件、试验设备、试验布置、试验程序和试验报告内容的描述。附录A中给出了试验方法的对照表，以帮助选择适当的测量方法。本文件的目的是描述通用条件，建立一个统一的测试环境以定量测量来自集成电路(IC)的射频(RF)骚扰。本文件描述了影响试验结果的关键参数。若与本文件的描述有所偏离，需在试验报告中明确注明。测量结果能用于产品比较或其他用途。通过对受控条件下IC产生的辐射射频骚扰或传导射频发射的电压和电流的测量，获得IC应用过程中可能产生的射频骚扰信息。IEC 61967的每个部分规定了所适用的频率范围。

Contents of GB/T 44937.1-2025


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