GB/T 44937.6-2025 English, GB/T 44937.6-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 6:Measurement of conducted emissions—Magnetic probe method (English)

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GB/T 44937.6-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 6:Measurement of conducted emissions—Magnetic probe method (English)
Standard No.:	GB/T 44937.6-2025	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	26000 words	Translation Price(USD):	1040.0 remind me the price change Email:
Implemented on:	2026-7-1	Delivery:	via email in 1~5 business day

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Standard No.:	GB/T 44937.6-2025
English Name:	Integrated circuits—Measurement of electromagnetic emissions—Part 6:Measurement of conducted emissions—Magnetic probe method
Chinese Name:	集成电路电磁发射测量第6部分：传导发射测量磁场探头法
Chinese Classification:	L56 Semiconductor integrated circuit
Professional Classification:	GB National Standard
Source Content Issued by:	SAMR;SAC
Issued on:	2025-12-31
Implemented on:	2026-7-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	26000 words
Translation Price(USD):	1040.0
Delivery:	via email in 1~5 business day

Standard

GB/T 44937.6-2025 Integrated circuits—Measurement of electromagnetic emissions—Part 6:Measurement of conducted emissions—Magnetic probe method (English)
Standard No.	GB/T 44937.6-2025
Status	valid
Language	English
File Format	PDF
Word Count	26000 words
Translation Price(USD)	1040.0
Implemented on	2026-7-1
Delivery	via email in 1~5 business day

Detail of GB/T 44937.6-2025

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Introduction of GB/T 44937.6-2025

本文件描述了使用微型磁场探头以非接触式的电流测量来评估集成电路（IC）引脚射频（RF）电流的方法。该方法测量IC在150 kHz～1 GHz频率范围内产生的RF电流，适用于标准试验板上的单个或一组IC的测量，以用来表征和对比IC的RF电流。该方法也用于评估实际使用的印制电路板（PCB）上的单个或一组IC的电磁特性以减小发射。该方法称为“磁场探头法”。

Contents of GB/T 44937.6-2025


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Keywords:
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