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Position: Chinese Standard in English/GB/T 4937.201-2018
GB/T 4937.201-2018   Semiconductor devices—Mechanical and climatic test methods—Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (English Version)
Standard No.: GB/T 4937.201-2018 Status:valid remind me the status change
Language:English File Format:PDF
Word Count: 14500 words Price(USD):430.00 remind me the price change
Implemented on:2019-1-1 Delivery: via email in 1~5 business day
Standard No.: GB/T 4937.201-2018
English Name: Semiconductor devices—Mechanical and climatic test methods—Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
Chinese Name: 半导体器件 机械和气候试验方法 第20-1部分:对潮湿和焊接热综合影响敏感的表面安装器件的操作、包装、标志和运输
Chinese Classification: L40    Semiconductor discrete devices in general
Professional Classification: GB    National Standard
ICS Classification: 31.080.01 31.080.01    Semiconductor devices in general 31.080.01
Issued by: SAMR; SAC
Issued on: 2018-09-17
Implemented on: 2019-1-1
Status: valid
Language: English
File Format: PDF
Word Count: 14500 words
Price(USD): 430.00
Delivery: via email in 1~5 business day
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