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| Position: Chinese Standard in English/GB/T 4937.32-2023 |
| GB/T 4937.32-2023 Semiconductor devices—Mechanical and climatic test methods—Part 32:Flammability of platic-encapsulated devices（externally induced） (English Version) | |||
| Standard No.: | GB/T 4937.32-2023 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 4000 words | Price(USD): | 120.0 remind me the price change |
| Implemented on: | 2023-12-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 4937.32-2023 |
| English Name: | Semiconductor devices—Mechanical and climatic test methods—Part 32:Flammability of platic-encapsulated devices（externally induced） |
| Chinese Name: | 半导体器件 机械和气候试验方法 第32部分：塑封器件的易燃性（外部引起的） |
| Chinese Classification: | L40 Semiconductor discrete devices in general |
| Professional Classification: | GB National Standard |
| ICS Classification: | 31.080.01 Semiconductor devices in general |
| Issued by: | SAMR; SAC |
| Issued on: | 2023-05-23 |
| Implemented on: | 2023-12-1 |
| Status: | valid |
| Language: | English |
| File Format: | |
| Word Count: | 4000 words |
| Price(USD): | 120.0 |
| Delivery: | via email in 1~3 business day |