Standard No.:	GB/T 4937.4-2012
English Name:	Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Chinese Name:	半导体器件 机械和气候试验方法 第4部分：强加速稳态湿热试验（HAST）
Chinese Classification:	L40    Semiconductor discrete devices in general
Professional Classification:	GB    National Standard
ICS Classification:	31.080.01 31.080.01    Semiconductor devices in general 31.080.01
Issued by:	AQSIQ;SAC
Issued on:	2012-11-5
Implemented on:	2013-2-15
Status:	valid
Language:	English
File Format:	PDF
Word Count:	4000 words
Price(USD):	120.00
Delivery:	via email in 1~3 business day

GB/T4937的本部分规定了强加速稳态湿热试验(HAST)方法,用于评价非气密封装半导体器件在潮湿的环境下的可靠性。