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| Position: Chinese Standard in English/GB/T 6620-1995 |
| GB/T 6620-1995 Test method for measuring warp on silicon slices by noncontact scanning (English Version) | |||
| Standard No.: | GB/T 6620-1995 | Status: | superseded remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 3000 words | Price(USD): | 90.0 remind me the price change |
| Implemented on: | 1995-1-2 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 6620-1995 |
| English Name: | Test method for measuring warp on silicon slices by noncontact scanning |
| Chinese Name: | 硅片翘曲度非接触式测试方法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| Issued by: | STSB |
| Issued on: | 1995-04-18 |
| Implemented on: | 1995-1-2 |
| Status: | superseded |
| Superseded by: | GB/T 6620-2009 Test method for measuring warp on silicon slices by noncontact scanning |
| Superseded on: | 2010-6-1 |
| Superseding: | GB 6620-1986 Standard method for measuring warp of silicon slices by noncontacting technique |
| Language: | English |
| File Format: | |
| Word Count: | 3000 words |
| Price(USD): | 90.0 |
| Delivery: | via email in 1~3 business day |