 |
|
Standard
| GB/T 8760-2020 Test method for dislocation density of monocrystal gallium arsenide (English Version) |
|
|
|
|
|
|
|
|
Detail of GB/T 8760-2020
| Standard No. |
|
| English Name |
|
| Chinese Name |
|
| Chinese Classification |
|
| Professional Classification |
|
| ICS Classification |
|
| Issued by |
|
| Issued on |
|
| Implemented on |
|
| Status |
|
| Superseded by |
|
| Superseded on |
|
| Abolished on |
|
| Superseding |
|
| Language |
|
| File Format |
| Word Count |
| Price(USD) |
|
| Keywords |
|
Introduction of GB/T 8760-2020
本标准规定了砷化镓单晶位错密度的测试方法。
本标准适用于、面砷化镓单晶位错密度的测试，测试范围为0 cm-2～100 000 cm-2 。
Contents of GB/T 8760-2020